Gary J Van Berkel

Gary J Van Berkel

Distinguished Scientist / Group Leader

Awards

2017 FLC Excellence in Technology Transfer Award - "SCIEX License of ORNL's Open Port Sampling Interfaces for Mass Spectrometry"​
2016 R&D 100 Award, “Open Port Sampling Interfaces for Mass Spectrometry"
2015 Analytical & Bioanalytical Chemistry - Best Paper Award, Co-author
2014 UT-Battelle Distinguished Inventor
2013 ORNL Director's Award (Scientist of the Year)
2013 ORNL Inventor of the Year
2013 Rapid Communications in Mass Spectrometry Beynon Prize
2010 R&D 100 Award, “Liquid Microjunction Surface Sampling Probe for Mass Spectrometry”
2009 FLC Southeast Region Excellence in Technology Transfer Project of the Year, “Surface Sampling Probe for Mass Spectrometry”
2005 ASMS Biemann Metal
2003 ORNL Awards Night: Science Communicator – “For Educating Public Officials about Technology Pertinent to Homeland Security and Advancing ORNL’s Role in Homeland Security”

Publications

Cahill, J. F.; Kertesz, V.; Weiskittel, T. M.; Vavrek, M.; Freddo, C.; Van Berkel, G. J.  Online, Absolute Quantitation of Propranolol from Spatially Distinct 20- and 40–μm Dissections of Brain, Liver, and Kidney Thin Tissue Sections by Laser Microdissection – Liquid Vortex Capture -Mass Spectrometry.  Anal. Chem. 2016, 88, 6026-6034.

Kertesz, V.; Weiskittel, T. M.; Vavrek, M. Freddo, C.; Van Berkel, G. J.  Extraction Efficiency and Implications for Absolute Quantitation of Propranolol in Mouse Brain, Liver and Kidney Tissue Sections Using Droplet-Based Liquid Microjunction Surface Sampling High-Performance Liquid Chomatography/Electrospray Ionization Tandem Mass Spectrometry.  Rapid Commun. Mass Spectrom.2016, 30, 1705-1712.

Tai, T.; Karácsony, O.; Bocharova, V.; Van Berkel, G. J.; Kertesz, V.  Topographical and Chemical Imaging of a Phase Separated Polymer using a Combined Atomic Force Microscopy/Infrared Spectroscopy/Mass Spectrometry Platform.  Anal. Chem. 2016, 88, 2864-2870.

Kertesz, V.; Cahill, J. F.; Van Berkel, G. J.  Quantitative Metrics for Assessment of Chemical Image Quality and Spatial Resolution.  Rapid Commun. Mass Spectrom. 2016, 30, 927-932.

Cahill, J. F.; Kertesz, V.; Van Berkel, G. J.   Laser Dissection Samples Modes for Direct Mass Spectral Analysis.  Rapid Commun. Mass Spectrom. 2016, 30, 611-619.

Chen, W.; Wang, L.; Van Berkel, G. J.; Kertesz, V.; Gan, J.  Quantitation of Repaglinide and Metabolites in Mouse Whole-Body Thin Tissue Sections using Droplet-Based Liquid Microjunction Surface Sampling-High Performance Liquid Chromatography-Electrospray Ionization Tandem Mass Spectrometry.  J. Chromatgr. A. 2016, 1439, 137-143.

Cahill, J.F.; Kertesz, V.; Van Berkel, G.J.  Characterization and Application of a Hybrid Optical Microscopy/Laser Ablation Liquid Vortex Capture/Electrospray Ionization System for Mass Spectrometry Imaging with Sub-Micrometer Spatial Resolution.  Anal. Chem. 2015, 87, 11113-11121.

Van Berkel, G.J.; Kertesz, V.  An Open Port Sampling Interface for Liquid Introduction Atmospheric Pressure Ionization Mass Spectrometry.  Rapid Commun Mass Spectrom. 2015, 29, 1749-1756.

Ovchinnikova, O.S.; Tamin, T.; Bocharova, V.; Okatan, M.B.; Belianinov, A.; Kertesz, V.; Jesse, S.; Van Berkel, G.J.  Co-registered Topographical, Band Excitation Nanomechanical and Mass Spectral Imaging using a Combined Atomic Force Microscopy/Mass Spectrometry Platform.  ACSNano, 2015, 9, 4260-4269.

Cahill, J.F.; Kertesz, V.; Ovchinnikova, O.S.; Van Berkel, G.J.  Comparison of Internal Energy Distributions of Ions Created by Electrospray Ionization and Laser Ablation-Liquid Vortex Capture/Electrospray Ionization.  J. Am. Soc. Mass Spectrom. 2105, 26, 1462-1468.

Ovchinnikova, O.S.; Bhandari, D.; Lorenz, M.; Van Berkel, G.J.  Transmission Geometry Laser Ablation into a Non-Contact Liquid Vortex Capture Probe for Mass Spectrometry Imaging.  Rapid Commun Mass Spectrom. 2014, 28, 1665-1673.

Kertesz, V.; Van Berkel, G.J.  Sampling Reliability, Spatial Resolution, Spatial Precision, and Extraction Efficiency in Droplet-Based Liquid Microjunction Surface Sampling.  Rapid Commun Mass Spectrom. 2014, 28, 1553-1560.

Lorenz, M.; Ovchinnikova, O.S.; Van Berkel, G.J.  Fully Automated Laser Ablation Liquid Capture Surface Analysis using NanoElectrospray Ionization Mass Spectrometry.  Rapid Commun Mass Spectrom. 2014, 28, 1312–1320.

Lorenz, M.; Ovchinnikova, O.S.; Kertesz, V.; Van Berkel, G.J.  Controlled Resonant Surface Tapping-Mode Scanning Probe Electrospray Ionization Mass Spectrometry Imaging.  Anal. Chem. 2014, 86, 3146-3152.

Ovchinnikova, O.S.; Kjoller, K.; Hurst, G.B.; Pelletier, D.A.; Van Berkel, G.J.  Atomic Force Microscope Controlled Topographical Imaging and Proximal Probe Thermal Desorption/Ionization Mass Spectrometry Imaging.  Anal. Chem. 2014, 86, 1083-1090.

Patents

Most recent out of a total of 24 issued patents:

U.S. Patent Application 14/682,837, filed April 9, 2015.  Open Port Sampling Interface.  Inventor:  G. J. Van Berkel.

U.S. Patent Application 14/682,847, filed April 9, 2015.  Capture Probe.  Inventors:  G. J. Van Berkel and V. Kertesz.

U.S. Patent 9,395,278 B2, July 19, 2016.  Surface Sampling Concentration and Reaction Probe with Controller to Adjust Sampling Position.  Inventors:  G. J. Van Berkel and M. S. ElNaggar.

U.S. Patent 9,390,901 B2, July 12, 2016.  System and Method for Liquid Extraction Electrospray-Assisted Sample Transfer to Solution for Chemical Analysis.  Inventors:  V. Kertesz and G. J. Van Berkel.

U.S. Patent 9,297,828 B2, March 29, 2016.  High Heating Rate Thermal Desorption for Molecular Surface Sampling.  Inventors:  O.S. Ovchinnikova and G. J. Van Berkel.

U.S. Patent 9,176,028 B2, November 3, 2015.  Ball Assisted Device for Analytical Surface Sampling. Inventors:  M. S. ElNaggar, G. J. Van Berkel, and T. R. Covey.

U.S. Patent 9,153,425 B2, October 6, 2015.  Device for High Spatial Resolution Chemical Analysis of a Sample and Method of High Spatial Resolution Chemical Analysis.  Inventor:  G. J. Van Berkel.

U.S. Patent 9,146,180 B2, September 29, 2015.  Systems and Methods for Laser Assisted Sample Transfer to Solution for Chemical Analysis.  Inventors:  G. J. Van Berkel, V. Kertesz, and O. S. Ovchinnikova.

U.S. Patent 9,140,633 B2, September 22, 2015.  Enhanced Spot Preparation for Liquid Extractive Sampling and Analysis.  Inventors:  G. J. Van Berkel and R. C. King.

U.S. Patent 9,064,680 B2, June 23, 2015.  AFM Fluid Delivery/Liquid Extraction Surface Sampling/Electrostatic Spray Cantilever Probe.  Inventor:  G. J. Van Berkel.

U.S. Patent 9,063,047 B2, June 23, 2015.  System and Method for Extracting a Sample from a Surface.    Inventors:  G. J. Van Berkel and T. Covey.

U.S. Patent 8,742,338 B2, June 3, 2014.  Systems and Methods for Laser Assisted Sample Transfer to Solution for Chemical Analysis.  Inventors:  G. J. Van Berkel, V. Kertesz, and O. S. Ovchinnikova.

U.S. Patent 8,637,813 B2, January 28, 2014.  System and Method for Laser Assisted Sample Transfer to Solution for Chemical Analysis.  Inventors:  G. J. Van Berkel and V. Kertesz.

U.S. Patent 8,519,330 B2, August 27, 2013.  Systems and Methods for Laser Assisted Sample Transfer to Solution for Chemical Analysis.  Inventors:  G. J. Van Berkel, V. Kertesz, and O. S. Ovchinnikova.

U.S. Patent 8,497,473 B2, July 30, 2013.  Electrospray Ionization Source with Reduced Analyte Electrochemistry.  Inventors:  V. Kertesz and G. J. Van Berkel.

U.S. Patent 8,486,703 B2, July 16, 2013.  Surface Sampling Concentration and Reaction Probe  Inventors:  G. J. Van Berkel and M. S. ElNaggar.

Licensed Patents:

Anasys Instruments Corporation, Santa Barabra, CA.  Licensed IP - U.S. Patent 8,384,020 B2, February 26, 2013.  Spatially Resolved Thermal Desorption/Ionization Coupled with Mass Spectrometry.  Inventors:  S. Jesse, G. J. Van Berkel, and O. S. Ovchinnikova.

DH Technologies Development Pte. Ltd., Singapore (Sciex).  Licensed IP – (1) U.S. Patent Application 14/682,837, filed April 9, 2015.  Open Port Sampling Interface.  Inventor:  G. J. Van Berkel.  (2) U.S. Patent Application 14/682,847, filed April 9, 2015.  Capture Probe.  Inventors:  G. J. Van Berkel and V. Kertesz. (3) U.S. Patent 9,153,425 B2, October 6, 2015.  Device for High Spatial Resolution Chemical Analysis of a Sample and Method of High Spatial Resolution Chemical Analysis.  Inventor:  G. J. Van Berkel.