Dr. Tamin Tai

Tamin Tai

research associate


Tamin Tai, B. G. Ghamsari, T. Bieler, Steven M. Anlage, “Nanoscale Nonlinear Radio Frequency Properties of Bulk Nb : Origins of Extrinsic Nonlinear Effects,” arXiv:1507.02777 (Phys. Rev. B. In Press)

Olga S. Ovchinnikova, Tamin Tai, Vera Bocharova, Mahmut Baris Okatan, Alex Belianinov, Vilmos Kertesz, Stephen Jesse, Gary J. Van Berkel, “Co-registered Topographical, Band Excitation Nanomechanical and Mass Spectral Imaging using a Combined Atomic Force Microscopy/Mass Spectrometry Platform,” ACS Nano 9 (4), pp 4260–4269 (2015).

Tamin Tai, B. G. Ghamsari, Steven M. Anlage, “Modeling the nanoscale linear response of superconducting thin films measured by a scanning probe microwave microscope,” Journal of Appl. Phys. 115, 203908 (2014).

Tamin Tai, B. G. Ghamsari, Tom Bieler, Steven M. Anlage, “Nanoscale Nonlinear Radio Frequency Properties of Bulk Nb: Origins of Extrinsic Nonlinear Effects’’ Appl. Phys. Lett. 104, 232603 (2014)

Tamin Tai, B. G. Ghamsari, Steven M. Anlage, “Nanoscale Electrodynamic Response of Nb Superconductors,” IEEE Trans. Appl. Supercond. 23, 7100104, (2013).
Tamin Tai, B. G. Ghamsari, T. Tan, C. G. Zhuang, X. X. Xi, Steven M. Anlage, “MgB2 Nonlinear Properties Investigated Under Localized High RF Magnetic Field Excitation,” Phys. Rev. ST Accel. Beams 15, 122002, (2012).

Tamin Tai, X. X. Xi, C. G. Zhuang, Dragos I. Mircea, Steven M. Anlage, “Nonlinear Near-Field Microwave Microscope For RF Defect Localization in Superconductors,” IEEE Trans. Appl. Supercond., 21, 2615-2618, (2011).

S. C. Pei, T. S. Ho, Ta-Min Tai, L. M. Lee, J. C. Chen, A. H. Kung, F. J. Kao, and S. L. Huang, “Drawing of single crystal and glass-clad lithium tantalate fibers by the laser-heated pedestal growth method,” Journal of Applied Crystallography, 43, 48-52, ( 2010).

L. M. Lee, S. C. Pei, D. F. Lin, M. C. Tsai, Ta-Min Tai, P. C. Chiu, D. H. Sun, A. H. Kung, and S. L. Huang, “Generation of tunable blue-green light using ZnO periodically poled lithium niobate crystal fiber by self-cascaded second-order nonlinearity,” Journal of the Optical Society of America B, 24, 1909-1915, (2007).

Specialized Equipment

Microscopy/Spectroscopy: Atomic Force Microscopy, Mass Spectroscopy, Near Field Microwave Microscope, Laser Scanning Microscope, Electron Microscope (Transmission Electron Microscopy, Scanning Electron Microscopy).

RF Measurement: Oscilloscope, Locking Amplifier, Network Analyzer, Spectrum Analyzer, High Speed Data Acquisition.

Nano Fabrication: Electron Beam Lithography, Focus Ion Beam System (FIB).