October 2007

Conference Paper

Using a High-Fidelity Simulation Framework for Performance Singularity Identification and Testing

By:
Scrapper, Chris; Madhavan, Rajmohan ; Balakirsky, Stephen
Page Number:
N/A
Book Title:
Proceedings of the IEEE Applied Imagery Pattern Recognition (AIPR) Workshop
Publication Date:
October 2007
Publisher Location:
IEEE Computer Society Press, Piscataway, New Jersey, United States of America
Conference Name:
IEEE Applied Imagery Pattern Recognition (AIPR) Workshop
Conference Location:
Washington, Virginia, United States of America