September 2005

Conference Paper

Resolution Quality and Atom Positions in Sub-?ngstr?m Electron Microscopy

By:
O'Keefe, Michael; Allard Jr, Lawrence F; Blom, Douglas
Page Number:
540CD
Volume:
11
Book Title:
Proceedings Microscopy and Microanalysis 2005
Publication Date:
September 2005
Conference Name:
Microscopy and Microanalysis 2005
Conference Location:
Honolulu, Hawaii, United States of America
Conference Sponsor:
Microscopy Society of America

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