August 2007

Journal

ORNL_SAS: Versatile software for calculation of small-angle x-ray and neutron scattering intensity profiles from arbitrary structures

By:
Heller, William T; Tjioe, Elina
Journal Name:
Journal of Applied Crystallography
Page Number:
782-785
Volume:
40
Issue Number:
N/A
Publication Date:
August 2007

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