June 2006

Journal

Mapping Misorientation and Crystallographic Tilt in GaN Layers Via Polychromatic Microdiffraction

By:
Barabash, Rozaliya I; Ice, Gene E; Liu, Wenjun ; Roder, C.; Figge, S.; Einfeldt, S.; Hommel, D.; Katona, T.; Speck, J.; DenBaars, S.; Davis, R.
Journal Name:
Physica Status Solidi B
Page Number:
1508-1513
Volume:
243
Issue Number:
7
Publication Date:
June 2006