September 2005

Conference Paper

High Resolution Imaging with an Aberration Corrected JEOL 2200FS-AC STEM/TEM

By:
Blom, Douglas ; Allard Jr, Lawrence F; O'Keefe, Michael; Mishina, Satoshi
Page Number:
548
Volume:
11
Book Title:
Proceedings Microscopy and Microanalysis 2005
Publication Date:
September 12, 2005
Conference Name:
Microscopy and Microanalysis
Conference Location:
Honolulu, Hawaii, United States of America
Conference Sponsor:
Microscopy Society of America

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