August 2005

Journal

Characterization of 6H-SiC/SiO2 Interfaces by EFTEM Elemental Mapping

By:
Bentley, James ; Chang, K.-C.; Porter, L.M.
Journal Name:
Microscopy and Microanalysis
Page Number:
494-495
Volume:
11
Issue Number:
supp2
Publication Date:
August 2005