July 2008

Conference Paper

Alpha Detector Pixelization Effects on NMIS Imaging

By:
Grogan, Brandon R; McConchie, Seth M; Mihalczo, John T; Mullens, James A
Page Number:
Abstract # 102
Book Title:
Proceeding of the 49th Annual Meeting of the Institute of Nuclear Materials Management
Publication Date:
July 2008
Publisher Location:
Institute of Nuclear Materials Management, Deerfield, Illinois, United States of America
Conference Name:
INMM
Conference Location:
Nashville, Tennessee, United States of America
Conference Sponsor:
INMM