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Publication

Multi-scale Low-dose Cryogenic TEM for Probing Beam-sensitive Thin-film Ionomer Variability Across Electrodes in Hydrogen Devices

by Juhyun Oh, Kimberly S Reeves, Timothy Van Cleve, David A Cullen, Michael J Zachman
Publication Type
Conference Paper
Journal Name
Microscopy and Microanalysis
Publication Date
Page Numbers
671 to 672
Volume
31
Issue
Supplement
Conference Name
Microscopy & Microanalysis
Conference Location
Salt Lake City, Utah, United States of America
Conference Sponsor
Microscopy Society of America
Conference Date
-
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