Publication

Deep Learning Based Sinogram Inpainting for Fast and High-quality Artifact Correction in Electron Tomography

by Obaidullah Rahman, Venkatakrishnan Singanallur Vaidyanathan, David A Cullen, Amir K Ziabari

Publication Type

Journal

Journal Name

Microscopy and Microanalysis

Publication Date

July, 2025

Page Numbers

2203 to 2205

Volume

31

Issue

Supplement

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