Pauling’s Rules is the standard model used to describe atomic arrangements in ordered materials. Neutron scattering experiments at Oak Ridge National Laboratory confirmed this approach can also be used to describe highly disordered materials.
A UCLA-led team that discovered the first intrinsic ferromagnetic topological insulator – a quantum material that could revolutionize next-generation electronics – used neutrons at Oak Ridge National Laboratory to help verify their finding.
An all-in-one experimental platform developed at Oak Ridge National Laboratory’s Center for Nanophase Materials Sciences accelerates research on promising materials for future technologies.
Scientists have found a new method to strategically add deuterium to benzene, an aromatic compound commonly found in crude oil. When applied to the active ingredient of drugs to incorporate deuterium, it could dramatically improve the drugs’ efficacy and safety and even introduce new medicines.
Oak Ridge National Laboratory researchers working on neutron imaging capabilities for nuclear materials have developed a process for seeing the inside of uranium particles – without cutting them open.
Researchers at ORNL and the National Renewable Energy Laboratory took inspiration from flying insects to demonstrate a miniaturized gyroscope, a special sensor used in navigation technologies.
Researchers used neutron scattering at Oak Ridge National Laboratory’s Spallation Neutron Source and High Flux Isotope Reactor to better understand how certain cells in human tissue bond together.
Researchers used neutron scattering at Oak Ridge National Laboratory’s Spallation Neutron Source to probe the structure of a colorful new material that may pave the way for improved sensors and vivid displays.
A new method developed at Oak Ridge National Laboratory improves the energy efficiency of a desalination process known as solar-thermal evaporation.
Researchers have pioneered a new technique using pressure to manipulate magnetism in thin film materials used to enhance performance in electronic devices.