- Jonathan D. Poplawsky, CNMS Electron and Atom Probe Microscopy Group
The popularity of Atom Probe Tomography (APT) for materials analysis has been rising recently with the advent of the local electrode atom probe (LEAP), faster computers, and improved lasers, allowing for rapid data collection from metals as well as non-metallic materials. APT is a direct projection magnification microscopy technique capable of sub-nanometer spatial resolution in three dimensions (3D) with ~10 ppm chemical sensitivity. Algorithms can be applied to APT datasets to mine important information from the 3D positions of the atoms within the analyzed volume of material. Examples of such data mining will be described in detail. Overall, the suite of tools available to mine APT data, and how this mined information provides insight for the design new materials, will be discussed.
Refreshmentswill be served at 9:30 am.