3D Analysis at the Nanoscale via Atom Probe Tomography: Metals and Beyond

3D Analysis at the Nanoscale via Atom Probe Tomography: Metals and Beyond

Presenter

  • Jonathan D. Poplawsky, CNMS Electron and Atom Probe Microscopy Group
November 8, 2017 - 10:00am to 11:00am

Abstract 

The popularity of Atom Probe Tomography (APT) for materials analysis has been rising recently with the advent of the local electrode atom probe (LEAP), faster computers, and improved lasers, allowing for rapid data collection from metals as well as non-metallic materials. APT is a direct projection magnification microscopy technique capable of sub-nanometer spatial resolution in three dimensions (3D) with ~10 ppm chemical sensitivity. Algorithms can be applied to APT datasets to mine important information from the 3D positions of the atoms within the analyzed volume of material. Examples of such data mining will be described in detail. Overall, the suite of tools available to mine APT data, and how this mined information provides insight for the design new materials, will be discussed.

Additional Information 

Refreshmentswill be served at 9:30 am.

Sponsoring Organization 

Physical Sciences Directorate

Location

  • Weinberg Auditorium
  • Building: 4500-N
  • Room: I-126

Contact Information

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