JEOL 6500F SEM

• High current, 30kV FE gun
• Secondary/BS electron imaging
• Low voltage imaging
• Si drift detector for X-ray micro- analysis (Z>3)
• Fast EDS spectrum imaging
• High speed EBSD/OIM camera
• Dry pumping system/in-situ plasma cleaning of specimens

Current Research Activities

• Structural characterization of high temperature alloys, composites, ceramics, nano-structured materials, environmental effects (oxidation, transformation)
• Low voltage operation to provide higher spatial resolution EDS analysis/mapping
• Elemental/phase distribution via EDS analysis/mapping (above), BSE imaging
• Phase identification and microtexture measurements with EBSD/OIM

Contact:

Shawn Reeves, 18x@ornl.gov - (865) 576-2489