agenda.jpg (15822 bytes)
[QCAV'2003] [Call for Papers] [Registration] [Location] [Agenda] [Committee] [Attractions]

6th International Conference on Quality Control by Artificial Vision
Location: Gatlinburg, Tennessee
Park Vista Hotel
Date: May 19-23, 2003
Purpose

The International Conference on Quality Control by Artificial Vision (QCAV) provides a forum for university, government laboratory, and industrial researchers to present and discuss innovative concepts and methods for improving the quality and efficiency of industrial processes through artificial vision. The presentations will include contributed papers and poster sessions as well as invited speakers. Papers will be presented that describe novel theoretical, experimental, and applied work in image processing and computer vision for industrial quality control through improved metrology, inspection, and process characterization.

 
PDF Version with Full Detailed Agenda

Monday May 19 Tuesday
May 20, 2003		 Wednesday
May 21, 2003		 Thursday
May 22, 2003
7:30AM-
8:45AM		  

Continental Breakfast
On-site Registration

 Continental Breakfast
On-site Registration		 Continental Breakfast
On-site Registration
8:45AM-
10:00AM		   Keynote Speaker:
Dr. Ralph C. Gonzalez		 Plenary Speaker:
Dr. Edward R. Dougherty		 Plenary Speaker:
Dr. Jan P. Allebach
10:00AM-
12:00PM		   Image Processing, Segmentation and Feature Analysis, I Vision Sensors and Systems, I Feature Analysis and Pattern Recognition, I 3-D Imaging Methods and Systems, I Process Automation, Characterization, and Control, I Special Session: Image Analysis for Face Identification
12:00PM-
1:30 PM		 Organizing Committee Meeting and Lunch Lunch Lunch Lunch

1:30PM -
3:00PM

 Image Processing, Segmentation and Feature Analysis, II Vision Sensors and Systems, II Feature Analysis and Pattern Recognition, II 3-D Imaging Methods and Systems, II Process Automation, Characterization, and Control, II Non-optical Image Measurement and Analysis

3:00PM-
3:30PM

 On-site Registration Coffee Break Coffee Break Coffee Break
3:30PM-
6:00PM

On-site Registration

Reception

 Image Processing, Segmentation and Feature Analysis, III Vision Sensors and Systems, III Poster Session Color and Multispectral Image Analysis Non-destructive Test and Analysis
6:00PM-
11:00PM		       Dinner and Awards Ceremony