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Staff Members

Staff members in the Microscopy Group have expertise in the following areas:

 

 

 

Electron Microscopy

Karren L. More

Group Leader

 

HREM and analytical TEM

 

morekl1@ornl.gov

 

 

(865) 574-7788

 

 

(865) 576-5413 FAX

 

     

Ana A. Hulsey

SHaRE Administrator and Section Secretary

 

hulseyaa@ornl.gov

 

 

Tel: 865.574.3955

 

 

Fax: 865.241.3650

 

   

Teresa C. Roe

Section Secretary

 

roetc1@ornl.gov

 

Tel: 865.574.7364

 

Fax: 865.576.5023

 

 

Sherry D. Samples

Section Secretary

 

samplessd@ornl.gov

 

Tel: 865.574.4267

 

Fax: 865.576.6298

 

 

Larry F. Allard

TEM/STEM, electron holography, HREM

 

allardlfjr@ornl.gov

 

Tel: 865.574.4981

 

 

Fax: 865.576.5413

 

     

Miaofang Chi

Aberration-Corrected TEM/STEM EELS

 

 

chim@ornl.gov

 

 

Tel: 865.241.4282

 

 

Fax: 865.576.5413

 
     

David Cullen

Aberration-corrected STEM and analytical TEM

 

 

cullenda@ornl.gov

 
 

Tel: 865.576.0230

 

 

Fax: 865.576.5413

 
   

Juan Carlos Idrobo

Aberration-corrected STEM and EELS

 

 

idrobojc@ornl.gov

 

 

Tel: 865.574.5659

 
 

Fax: 865.576.5413

 
     

Donovan N. Leonard

FIB, TEM, aberration-corrected STEM and EELS

 

 

leonarddn@ornl.gov

 

 

Fax: 865.574.5067

 

 

 

 

Chad M. Parish

EBSD/OIM, analytical TEM/STEM, and MVSA

 

parishcm@ornl.gov

 

 

Tel: 865.574.0092

 

 

Fax: 865.576-5413

 

 

 

 

Kelly A. Perry

Soft-materials microscopy

 

 

perryka@ornl.gov

 

 

Tel: 865.241.4242

 

 

Fax: 865.576-5413

 
     

Kinga A. Unocic

Analytical TEM/STEM

 

 

unocicka@ornl.gov

 

 

Tel: 865.574.0966

 

 

Fax: 865.576-5413

 

 

 

 

Raymond R. Unocic

In-situ microscopy, analytical TEM/STEM

 

unocicrr@ornl.gov

 

 

Tel: 865.574.0096

 

 

Fax: 865.576-5413

 
   

Atom Probe

Michael K. Miller

Local Electrode Atom Probe, site-specific AP specimen
preparation using FIB, statistical data analysis

 

millermk@ornl.gov

 

 

Tel: 865.574.4719

 

 

Fax: 865.241.3650

 

     

Surface Science

Harry M. Meyer

XPS, Auger Electron Spectroscopy

 

meyerhmiii@ornl.gov

 

 

Tel: 865.574.5092

 

 

Fax: 865.576.5413

 

     

Specimen Preparation and Support Staff

Dorothy W. Coffey

FIB, SEM

 

coffeydw@ornl.gov

 

 

Tel: 865.576.7688

 

 

Fax: 865.576.5413

 
     

K. Shawn Reeves

Microtomy, FIB, SEM, image analysis

 

trent@ornl.gov

 

 

Tel: 865.576.2489

 

 

Fax: 865.576.5413

 
     

Kathy A. Powers

TEM/SEM specimen preparation of metals and ceramics

 

powerska@ornl.gov

 

 

Tel: 865.574.5094

 

 

Fax: 865.241.3650

 
     
 

 Oak Ridge National Laboratory