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Instrumentation and Capabilities

Instrumentation and associated capabilities available in the Microscopy Group, including point-of-contact (POC).

Transmission Electron Microscopy (TEM and STEM):

JEOL 2200FS - 200kV aberration-corrected TEM/STEM with EELS, EFTEM

 

Philips CM200 FEG-TEM/STEM - 200kV, Schottky emitter, EDS spectral imaging, EELS

 

FEI Titan 80-300 - 80-300kV, Schottky emitter, aberration-corrected TEM/STEM, EELS

 

  • Currently part of developmental TEAM Project
  • POC - Ed Kenik

Scanning Electron Microscopy:

Hitachi S3400 Variable Pressure SEM - EDS, SE and BSE imaging

 

JEOL 6500 FEG SEM - SE and BSE imaging, EDS, microcalorimeter EDS

 

  • Available via SHaRE User Center
  • POC - Ed Kenik

Electron Probe Microanalysis:

JEOL JXA-8200 FEG SEM - WDS and EDS

 

Atom Probe:

Imago Scientific Instruments Local Electrode Atom Probe (LEAP)

 

FEI Nova 200 Dual-Beam FIB

 

  • Available via SHaRE User Center (support instrument only)
  • POC - Mike Miller

Surface Science:

Physical Electronics PHI 680 Scanning Auger Nanoprobe

 

Thermo Scientific K-Alpha XPS

 
  • Available via HTML and SHaRE User Centers Centers
  • POC - Harry Meyer

Specimen Preparation:

Leica UCT Ultramicrotome (RT and cryo) for TEM preparation

 
  • Available by special request (full cost recovery)
  • POC - K.S. Reeves

Hitachi FB-2000A FIB for TEM lift-out sample preparation

 

SEM/TEM Specimen Preparation Labs

 

Traditional ceramic and cross-section TEM preparation

 

Traditional electropolishing for TEM preparation

 

  • Available via SHaRE and HTML User Centers Centers
  • POC - Kathy Thomas

Atom Probe needle preparation

 

Metallography

 

  • Available via HTML and SHaRE User Centers Centers (full cost recovery)

 

 

 

 

 


 Oak Ridge National Laboratory