PHI 680 Scanning Auger Nanoprobe

This instrument can be downloaded and is provided here in Adobe PDF formats.

Techniques/Capabilities:

• Provides elemental and some chemical information
• Surface sensitive (top 3-5 nm)
• High spatial resolution
• Ar+-ion depth profiling
• In-situ fracture stage

Current Research Activities:

• Grain boundary characterization of metals and alloys
• 3-D thin film characterization using elemental mapping and depth profiling
• Corrosion and failure analysis

Contact: Harry M. Meyer, meyerhmiii@ornl.gov (865) 574-5092