|
JEOL 2200FS Aberration-Corrected STEM
This instrument can be downloaded and is provided here in Adobe PDF formats.
Techniques/Capabilities:
- Aberration-corrected electron probe <100pm high angle annular dark field (HAADF) imaging
- Simultaneous BF/DF-STEM
- Atomic column resolution EELS
- STEM EELS spectrum imaging
- EFTEM spectrum imaging
- Remote access/operation
Current Research Activities:
- Bimetallic catalyst characterization
- Ex-situ studies of catalyst nanostructure evolution
- High resolution Z-contrast imaging of complex oxides
|
|
 |
|
|
|
|
