The Oak Ridge Chapter of ASM International, in partnership with Oak Ridge National Laboratory is proud to organize ASM Educational Symposium: Microscopy, Modeling, and Beyond, May 21, 2012, Pollard Technology Conference Center, 210 Badger Ave., Oak Ridge, Tennessee.

The educational symposium is directed to the university, industry and government communities involved in materials science and engineering. Innovations in Material Characterization will focus on recent developments in advanced techniques, as well as in applications of results to the prediction of material behavior in service.

WHO SHOULD ATTEND:

Researchers and students involved in materials science & engineering and people interested in innovations in microstructural characterization of materials and for development of understanding of material behavior.

TOPICS INCLUDE:

• Atom probe tomography
• Positron Annihilation Spectroscopy
• Electron microscopy as a materials problem-solving tool
• Scanning probe microscopy
• SANS and SAXS for engineering materials
• Neutron imaging and tomography
• High energy X-ray imaging and tomography
• Generation of physically informed predictive models for nuclear materials
• Generation of predictive models using atom probe data for specialty steels

PROGRAM: Program Schedule [pdf]

KEY DATES:

May 17, 2012: Registration Deadline (On-line Registration required)

May 18, 2012: Cancellation Deadline (Contact Treasurer)

REGISTRATION FEE:

General: $120
*Student: $30
Retiree: $40
Invited Speaker: NO FEE (Registration required only)

* Limited travel support for students available on request

ANNOUNCEMENT:

Click on image to download Announcement [pdf]

For more information, contact organizers:

Andrew Payzant, payzanta@ornl.gov (865-235-4981)
Randy K. Nanstad, nanstadrk@ornl.gov (865-574-4471)