Microstructural Characterization of Radiological Samples:

Transmission and Scanning Transmission Electron Microscopes:

• Philips CM200 FEG TEM/STEM with EDS, EELS
  Contact – Jim Bentley, bentleyj@ornl.gov
• FEI Tecnai 20 TEM with EDS
  Contact – Jim Bentley, bentleyj@ornl.gov
• Hitachi HF-3300 TEM/STEM with EDS
  Contact - Jane Howe, howej@ornl.gov

Scanning Electron Microscopes:

• Philips XL30 FEG-SEM with EDS and OIM
  Contact – Ed Kenik, kenikea@ornl.gov
• JEOL 6500 FEG-SEM with SDD-EDS
  Contact – Ed Kenik, kenikea@ornl.gov

Atom Probe Facility:

• Imago Scientific Local Electrode Atom Probe (LEAP)
  Contact – Mike Miller, (865) 574-4719

X-Ray Photoelectron Spectrometry:

• Thermo Scientific K-Alpha XPS
  Contact – Harry Meyer, meyerhmiii@ornl.gov
• Raman Spectroscopy
  Contact – Michael Lance, lancem@ornl.gov
• Thermography: IR Camera
  Contact – Ralph Dinwiddie, dinwiddierb@ornl.gov

Residual Stress of Radiological Samples:

• Four-Circle Goniometers with 18-kW Rotating Anode X-Ray or 2-kW X-Ray Tube Sources
• Large Specimen X-Ray Diffractometer
• Neutron Diffraction Residual Stress Mapping Facility

X-ray Characterization of Radiological Samples:

• Multipurpose X-Ray Powder Diffraction
• High-Temperature X-Ray Powder
  Diffractometer
• Low-Temperature X-ray Powder Diffraction
• Room-Temperature X-ray Powder Diffractometer