Meeting the Challenge of Making Semiconductor Chips with Copper Interconnects

The Chemical Technology Division at Oak Ridge National Laboratory collaborated with SEmiconductor MAnufacturing TECHnology (SEMATECH), a consortium of ten leading semiconductor and chip-making companies in the U.S., to develop a viable process for the next generation of high-performance chips. Copper is poised to replace aluminum as the main on-chip conductor for all types of integrated circuits. The incorporation of copper poses strong challenges in materials, processes, ultra-pure water usage, and the impact of copper-containing waste discharges to the environment. These challenges must be met within acceptable standards to manufacture high-performance semiconductor chips of the future. To date, good quality deposits have been obtained while extending the life of the electroplating solution by more than 100%.

Technical Issues

  • Copper is known as a fast diffuser and can act to "poison" an active device, for example, the source/drain/gate region of a transistor. To mitigate the undesirable effects of copper diffusion, development of advanced diffusion barriers is required.
  • Implementation of an entirely new manufacturing technique is required.
  • The problem of uneven current densities causes trenches and vias in the circuitry to be filled unevenly. This problem will be exacerbated as interconnects are made smaller, approaching 0.07 micron.
  • Copper requires large amounts of ultra-pure water. About 40% of the operating costs of a semiconductor fabrication plant will be for production and use of ultra-pure water.
  • Water recycle, water reuse and the release of copper to the environment are critical.

    For further information, contact
    M. R. Ally
    Oak Ridge National Laboratory
    Email: allymr@ornl.gov

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Copper chemical-mechanical planarization (CMP) for damascene structures involves developing a polish process that minimizes the pattern density and feature size effects associated with typical CMP processes. Development is complicated due to new barrier materials and the lack of commercial slurries.

Accomplishments

  • ORNL engineers working in conjunction with SEMATECH have extended the life of the copper bath by over 100% through analysis and process modifications.
  • The quality of copper electro-deposited on the wafer was confirmed by detailed elemental analysis and scanning electron microscopy.
  • Extension of the life of the copper bath means cost savings and lower disposal costs.
  • Methods for recovering copper from spent CMP slurries are being tested.

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