ORNL Center for Innovation and Application of
Mass Spectrometry for Homeland Security
and National Defense

Mass Spectrometry Intellectual Property and
Buisness Relationships at ORNL

For more information on the intellectual property listed here of other intellectual property at ORNL please contact:

Gary Van Berkel et al.: Electrospray Mass Spectrometry; planar flow-by and planar flow-through electrode emitters, and capacitive electrospray source. Collaborators are ESA Biosciences, Inc. (http://www.esainc.com/index.html) and MDS-Sciex (http://www.mdssciex.com).

Gary Van Berkel et al.: Automated surface sampler for spray ionization sources.

Peter Reilly: Ultra-high Mass digital ion trap mass spectrometry.

Peter Reilly: Ultrasensitive glow discharge ion source for aerosol and gas analysis.

William {Bill} Whitten et al.: Pulsed discharge ionization source for miniature ion mobility spectrometers, resistive glass drift tube for controlled KE ion source.

Cyril Thompson and Mark Wise: Mass Spectrometer Sample Introduction System with sample archival. Atomizing, continuous water monitoring module, in-line real time air monitor, in-situ continuous water monitoring system, in-situ continuous water analyzing module. Licensed to Tri-corder Environmental.

Douglas {Doug} Goeringer et al.: Tandem in-time and in-space mass spectrometer and associated method for MS/MS operation.

William {Bill} Whitten and J. Michael Ramsey: Microscale ion trap mass spectrometer. Licensed to Protasis (http://www.protasis.com/).

Provided by Oak Ridge National Laboratory, managed by UT-Battelle, LLC,
 for the U.S. Department of Energy