P.O. Box 2008, Oak Ridge National Lab, Oak Ridge ,TN 37831-6075
Wk: (865) 574-0342, Fax: (865) 576-8993
E-mail: hyltonkw@ornl.gov

B.S. Computer Science, Tennessee Technological University, Cookeville, TN, 1988
 

ACM Rising Star Award, 1994

National Federal Laboratory Consortium Award for Excellence in Technology Transfer, 2001
 

J.R. Price, K.W. Hylton, K.W. Tobin, P.R. Bingham, J.D. Hunn, and J.R. Haines, “ Detection of Cavitiation Pits on Steel Surfaces Using SEM Imagery,” Sixth International Conference on Quality Control by Artificial Vision, SPIE, Vol. 5132, p. 476-484, May 2003.

C. E. Thomas Jr., M. A. Hunt, T. M. Bahm, L. R. Baylor, P. R. Bingham, M. D. Chidley, X. Dai, A. El-Khashab, J. M. Gilbert, J. S. Goddard, G. R. Hanson, J. D. Hickson, K. W. Hylton, G. C. John, M. L. Jones, M. W. Mayo, C. Marek, J. H. Price, D. A. Rasmussen, L. J. Schaefer, M. A. Schulze, B. Shen, R. G. Smith, A. N. Su, K. W. Tobin, W. R. Usry, E. Voelkl, K. S. Weber. "Direct to digital holography for high aspect ratio inspection of semiconductor wafers." Presented at the 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, March 2003.

J. Price, K. Hylton, K.Tobin, P. Bingham, J. Hunn, J. Haines. “Detection of Cavitation Pits on Steel Surfaces using SEM Imagery,” in Proceedings of the 6th International Conference on Quality Control by Artificial Vision, SPIE vol. 5132, pp. 476-484, April 2003.

C. E. Thomas Jr., T. M. Bahm, L. R. Baylor, P. R. Bingham, S. W. Burns, M. D. Chidley, X. Dai, R. J. Delahanty, C. J. Doti, A. El-Khashab, R. L. Fisher, J. M. Gilbert, J. S. Goddard, G. R. Hanson, J. D. Hickson, M. A. Hunt, K. W. Hylton, G. C. John, M. L. Jones, K. R. MacDonald, M. W. Mayo, I. MacMackin, D. R. Patek, J. H. Price, D. A. Rasmussen, L. J. Schaefer, T. R. Scheidt, M. A. Schulze, P. D. Schumaker, B. Shen, R. G. Smith, A. N. Su, K. W. Tobin, W. R. Usry, E. Voelkl, K. S. Weber, P. G. Jones, and R. W. Owen. "Direct to digital holography for semiconductor wafer defect detection and review." Design, Process Integration, and Characterization for Microelectronics, Proc. SPIE v. 4692, pp. 180-194, March 2002.

K.W. Tobin, Jr., M.A. Hunt, J.S. Goddard, Jr., K.W. Hylton, R.K. Richards, M.L. Simpson, D.A. Treece, “Accommodating multiple illumination sources in an imaging colorimetry environment,” Proceedings of SPIE: Machine Vision Applications in Industrial Inspection VIII, Vol. 3966, January 2000.

M.A. Hunt, J.S. Goddard, K.W. Hylton, T.P. Karnowski, M.L. Simpson, K.W. Tobin, Jr., and D.A. Treece, “Tristimulus Color Measurement of Printed Textile Patterns Using the POCS Algorithm,” Proceedings of SPIE: Machine Vision Applications in Industrial Inspection VII, Vol. 3652, January 1999.