P.O. Box 2008, Oak Ridge National Lab, Oak Ridge ,TN 37831-6075
Wk: (865) 574-9034, Fax: (865) 576-8993
E-mail: goddardjsjr@ornl.gov

Electrical Engineering, University of Maryland, College Park MD, 1974

"Four-dimensional characterization of a sheet-forming web," U.S. Patent No. 6,553,133, April 22, 2003.
 

An ORNL significant event award was given to the project team in 2003 for development of a stereo-based animal tracking system for ORNL's mouse genetics program.

An Excellence in Technology Transfer award was presented by the Federal Laboratory Consortium to the project team in 2002 for "Direct to Digital Holography for High-Speed, High Resolution Defect Inspection."
 

A.G. Weisenberger, B. Kross, S. Majewski, V. Popov, M.F. Smith, B. Welch R. Wojcik, J. S. Goddard, S. S. Gleason, M. J. Paulus, S.R. Meikle, M. Pomper, “A Small Animal SPECT Imaging System Utilizing Position Tracking of Un-anesthetized Mice,” NIBIB Workshop on Small-Animal SPECT, University of AZ, January 2004.

A.G. Weisenberger, B. Kross, S. Majewski, V. Popov, M.F. Smith, B. Welch R. Wojcik, S. Gleason, J. Goddard, M. Paulus, and S.R. Meikle, “Development and Testing of a Restraint Free Small Animal SPECT Imaging System with Infrared Based Motion Tracking,” Proc. IEEE Medical Imag­ing Conference, November 2003.

J. Goddard, S. Gleason, M. Paulus, R. Kerekes, S. Majewski, V. Popov, M. Smith, A. Weisenberger, B. Welch, and R. Wojcik, " Pose measurement and tracking system for motion-correction of unrestrained small animal PET/SPECT imaging," Proc. IEEE Medical Imaging Conference, October 2003.

R. A. Kerekes, J. S. Goddard, S. S. Gleason, M. J. Paulus, A. G. Weisenberger, M. F. Smith, B. Welch, "Two methods for tracking small animals in SPECT imaging," to be published in Proceedings of SPIE: 6th International Conference on Quality Control by Artificial Vision, May 2003.

C. E. (Tommy) Thomas Jr., Martin A. Hunt, Tracy M. Bahm, Larry R. Baylor, Philip R. Bingham, Matthew D. Chidley, Xiaolong Dai, Robert J. Delahanty, Ayman El-Khashab, Judd M. Gilbert, James S. Goddard, Gregory R. Hanson, Joel D. Hickson, Kathy W. Hylton, George C. John, Michael L. Jones, Michael W. Mayo, Christopher Marek, John H. Price, David A. Rasmussen, Louis J. Schaefer, Mark A. Schulze, Bichuan Shen, Randall G. Smith, Allen N. Su, Kenneth W. Tobin, William R. Usry, Edgar Voelkl, Karsten S. Weber, Robert W. Owen, " Direct To Digital Holography For High Aspect Ratio Inspection of Semiconductor Wafers," ULSI Metrology Conference Invited Paper, Austin, TX, March 2003.

M. Paulus, S. Gleason, J. Goddard, S. Kennel, J. Wall, A. Solomon, J. Gregor, and more, "Initial results with a small animal microSPECT/CT imaging system", High-resolution Molecular Imaging in Small Animals (IMI/HiRes), Madrid, Spain, Sep. 2003.

S. Gleason, James Goddard, Michael Paulus, Ryan Kerekes, Andrew Weisenberger, Stan Majewski, Mark Smith, Ben Welch, “Automated Pose Determination for Unrestrained, Non-anesthetized Small Animal Micro-SPECT and Micro-CT Imaging,” Proc. Society of Molecular Imaging Conf., August 2003.

R. A. Kerekes, J. S. Goddard, S. S. Gleason, M. J. Paulus, A. G. Weisenberger, M. F. Smith, B. Welch, “Two methods for tracking small animals in SPECT imaging,” Proc. Quality Control by Articial Vision, May 2003.

J. Goddard, S. Gleason, M. Paulus, A. Weisenberger, M. Smith, B. Welch, and R. Wojcik, "Real-time landmark-based unrestrained animal tracking system for motion-corrected PET/SPECT imaging," Proc. IEEE Medical Imaging Conference, November 2002.

Tobin, K. W., Karnowski, T.P., Arrowood, L.F., Ferrell, R.K., Goddard, J.S., Lakhani, F., "Content-based Image Retrieval for Semiconductor Process Characterization", EURISP Journal on Applied Signal Processing, Special Issue on Applied Visual Inspection, Vol. 2002, No. 7, July 2002.

C. E. Thomas Jr., T. Bahm, S. Burns, L. Dai, R. Delahanty, C. Doti, A. El-Khashab, R. Fisher, J. Gilbert, J. Hickson, M. Hunt, G. John, M. Jones, K. Macdonald, M. Mayo, I. McMackin, J. Price, L. Schaefer, T. Scheidt, M. Schulze, P. Schumaker, B. Shen, R. Smith, A. Su, E. Voelkl, K. Weber (nLine Corporation, Austin, TX, 78744) L. Baylor, P. Bingham, M. Chidley, J. Goddard, G. Hanson, K. Hylton, D. Patek, D. Rasmussen, K. Tobin (Oak Ridge National Laboratory, Oak Ridge, TN, 37831) , "Direct To Digital Holography for Semiconductor Wafer Defect Detection And Review," Proceedings of SPIE: Design, Process Integration, and Characterization for Microelectronics, Vol. 4692, pp. 180- 194, March 6- 7, 2002.

A.G. Weisenberger, B. Kross, S. Majewski, V. Popov, M.F. Smith, B. Welch, R. Wojcik, M. J. Paulus, J. S. Goddard, S. S. Gleason, S.R. Meikle, M. Pomper, "Development of a Restraint Free Small Animal SPECT Imaging System," Academy of Molecular Imaging Annual Conference, San Diego, CA, October 2002.

J.S. Goddard, “Four-Dimensional Characterization of Paper Web at the Wet End,” Oak Ridge National Laboratory, Oak Ridge, TN, ORNL/TM 2000/ 387, January 2001.

H. Sari-Sarraf, J.S. Goddard, B.R. Abidi, and M.A. Hunt, "Vision System for On-Line Characterization of Paper Slurry," International Journal of Imaging Systems and Technology, pp. 231- 242, Vol. 11, No. 4, 2000.

M.A. Hunt, J.S. Goddard, Jr., R.K. Ferrell, J.A. Mullens, B.R. Whitus, Oak Ridge National Laboratory; A. Ben-Porath, Applied Materials (Israel), “Hierarchical-based multiple classifier system for automatic defect classification,”Proceedings of SPIE: Metrology, Inspection, and Process Control for Microlithography XIV, February 2000.

K.W. Tobin, Jr., M.A. Hunt, J.S. Goddard, Jr., K.W. Hylton, R.K. Richards, M.L. Simpson, D.A. Treece, “Accommodating multiple illumination sources in an imaging colorimetry environment,” Proceedings of SPIE: Machine Vision Applications in Industrial Inspection VIII, Vol. 3966, January 2000.

B.R. Abidi, H. Sari-Sarraf, J.S. Goddard, and M.A. Hunt, “Facet Model and Mathematical Morphology for Surface Characterization,” Proceedings of SPIE: Intelligent Robots and Computer Vision XVIII: Algorithms, Techniques, and Active Vision, Vol. 3837, September 1999.

H. Sari-Sarraf and J.S. Goddard, "Vision System for On-Loom Fabric Inspection," IEEE Transactions on Industry Applications, November/December 1999.

J.S. Goddard, H. Sari-Sarraf, J.C. Turner, M.A. Hunt, and B.R. Abidi, "Depth Measurement of Moving Slurry at the Wet End of a Paper Machine," Proceedings of SPIE: Machine Vision Applications in Industrial Inspection VII, Vol. 3652, January 1999.

M.A. Hunt, J.S. Goddard, K.W. Hylton, T.P. Karnowski, M.L. Simpson, K.W. Tobin, Jr., and D.A. Treece, “Tristimulus Color Measurement of Printed Textile Patterns Using the POCS Algorithm,” Proceedings of SPIE: Machine Vision Applications in Industrial Inspection VII, Vol. 3652, January 1999.

K.W. Tobin, J.S. Goddard, and C.E. Thomas, "Defect Detection and Analysis on Direct-to-Digital Holographic Imagery," Technology Transfer 98123641 A-TR, SEMATECH, Austin, TX, December 1998.

H. Sari-Sarraf, J.S. Goddard, J.C. Turner, M.A. Hunt, and B.R. Abidi, “On-Line Characterization of Slurry for Monitoring Headbox Performance,” TAPPI Process & Product Quality Conference, Milwaukee, WI, October 1998.

H. Sari-Sarraf and J.S. Goddard, "Robust Defect Segmentation in Woven Fabrics," IEEE Conference on Computer Vision and Pattern Recognition, Santa Barbara, CA, June 1998.

J.S. Goddard, "Pose and Motion Estimation Using Dual Quaternion-Based Extended Kalman Filtering," Proceedings of SPIE: Three-Dimensional Image Capture and Applications, Vol. 3313, January 1998.

D.R. Patek, J.S. Goddard, and T. Karnowski, "Rule-based inspection of printed green ceramic tape," Proceedings of SPIE: Machine Vision Applications in Industrial Inspection VI, Vol. 3306, January 1998.

J.S. Goddard, Pose and Motion Estimation from Vision Using Dual Quaternion-Based Extended Kalman Filtering, Ph.D. Dissertation, University of Tennessee, Knoxville, 1997.

H. Sari-Sarraf and J.S. Goddard, "Four Dimensional Characterization of Paper Web at Wet End," Oak Ridge National Laboratory, Oak Ridge, TN, ORNL/TM- 13528, October 1997.

H. Sari-Sarraf and J.S. Goddard, "On-line Optical Measurement and Monitoring of Yarn Density in Woven Fabrics," Photonics China ' 96 Symposium on Automated Optical Inspection for Industry: Theory, Technology, and Application, Beijing, China, pp. 444- 452, November 1996.

M.A. Hunt, S.S. Gleason, J.S. Goddard, T.P. Karnowski, H. Sari-Sarraf, D.N. Sitter, and K.W. Tobin, “Sort Floor Optical Inspection Tool: A Feasibility Study,” Oak Ridge National Laboratory, Oak Ridge, TN, ORNL/TM- 5302, September 1996.

W.B. Jatko, J.S. Goddard, R.K. Ferrell, S.S. Gleason, J.S. Hicks, and K. Varma, "Crusader Automated Docking System Phase III Report," Oak Ridge National Laboratory, Oak Ridge, TN, ORNL/TM- 13177, March 1996.

K.W. Tobin, D.B. Allen, J.S. Goddard, J.P. Jones, D.N. Sitter, E.R. Tapp, and J.C. Turner, "RGB Field System Data Collection and Testing for Textile Print Finishing," Oak Ridge National Laboratory, Oak Ridge TN, ORNL/TM- 13097, September 1995.

W.B. Jatko, J.S. Goddard, S.S. Gleason, and R.K. Ferrell, "Docking Related Technology Phase II Report," Oak Ridge National Laboratory, Oak Ridge, TN, ORNL/TM- 12870, April 1995.

J.S. Goddard, W.B. Jatko, R.K. Ferrell, and S.S. Gleason, "Robust Determination for Autonomous Docking," ANS 6th Topical Meeting on Robotics and Remote Systems, Monterey CA, February 1995.

D.N. Sitter, Jr., J.S. Goddard, and R.K. Ferrell, "Method for the Measurement of the Modulation Transfer Function of Sampled Imaging Systems from Bar-Target Patterns," Applied Optics, Vol. 34, No. 4, pp. 746- 751, 1995.