P.O. Box 2008, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6075
Wk: (865) 574-5730, Fax: (865) 576-8993
E-mail: ferrellrk@ornl.gov

Regina K. Ferrell joined the Image Science and Machine Vision Group at Oak Ridge National Laboratory in 1992 as a research and development staff member. Her most recent work has been in the field of automated x-ray baggage image analysis for threat assessment. Her work utilized region-based image database querying to assist in the assessment of suspicious organic objects found in baggage x-ray images. She has also recently been involved in the automated classification of semiconductor wafer defects for high-resolution, multi-perspective SEM imaging. She is a co-inventor on two pending patents on the retrieval of industrial images. In her 12 years at ORNL, she has been involved in a number of large systems tasks that include the following. She was on a team that developed and demonstrated techniques that use 2-D vision for performing 3-D docking maneuvers for future generation Army weapons systems. She directed the preliminary assembly and testing of a system to monitor the decommissioning of nuclear components in the Soviet Union. She developed and enhanced a monitoring system for electronic fingerprint submissions and quality control processing for the FBI. Ms. Ferrell is a member of the Institute of Electrical and Electronics Engineers (IEEE).

Electrical Engineering, University of Tennessee, Knoxville, Tennessee, 1992.

Ferrell, R. K., Tobin, K. W., Karnowski, T. P., “Method for Indexing and Retrieving Manufacturing-Specific Digital Imagery Based on Image Content”, ERID No. 0668/Q&B 6321-131, September 1999. U.S. Patent No. TBD, 2004.

Ferrell, R. K., Tobin. K. W., Karnowski, T. P., Ferrell, R. K., “Method for Localizing and Isolating an Errant Process Step”, U.S. Patent No. 6,535,776, March 18, 2003.

National Federal Laboratory Consortium Award for “Automated Image Retrieval System for Semiconductor Yield Improvement,” recognition for Excellence in Technology Transfer, May 2003.

Southeast Region Federal Laboratory Consortium Award for “Automated Image Retrieval Technology,” recognition for Excellence in Technology Transfer, January 2003.

R&D Magazine’s R&D 100 Award for applied research in the development of the Defect Source Identifier – Automated Image Retrieval (DSI-AIR) System for Semiconductor Image Data Management, 2002.

UT-Battelle, LLC, Awards Night Director’s Award for Outstanding Team Accomplishment in Science and Technology, for Successful Development of a Content-Based Image Retrieval System for Semiconductor Yield Improvement October 2002.

UT-Battelle, LLC, Awards Night Award for Team Technical Achievement for Developing a Tree-Based Pattern Analyzer System for Semiconductor Yield Learning, 2000.

Lockheed Martin, Awards Night Award for Technical Achievement for Electronic Fingerprint Image Print Server, 1999.

Ferrell, R. K, Gleason, S. S., and Tobin, K. W., “Application of Fractal Encoding Techniques for Image Segmentation,” IEEE/SME/SPIE 6th International Conference on Quality Control by Artificial Vision, Proceedings of the SPIE, Vol. 5132, May 2003.

Gleason, S. S., Ferrell, R. K., Karnowski, T. P., Tobin, K. W., “Detection of Semiconductor Defects Using A Novel Fractal Encoding Algorithm,” Design, Process Integration, and Diagnostics in IC Manufacturing, Proceedings of the SPIE, Vol. 4692, March 2002.

Tobin, K. W., Karnowski, T. P., Arrowood, L. F., Ferrell, R. K., Goddard, J. S., and Lakhani, F., “Content-Based Image Retrieval for Semiconductor Process Characterization,” EURASIP Journal on Applied Signal Processing, Special Issue on Applied Visual Inspection, Vol. 2002, No. 7, 2002.

Karnowski, T. P., Tobin, K. W., Ferrell, R. K., and Lakhani, F., “Using an Image Retrieval System for Image Data Management,” Design, Process Integration, and Diagnostics in IC Manufacturing, Proceedings of the SPIE, Vol. 4692, March 2002.

Ferrell, R. K. and Tobin, K. W, “Adaptation of a Focus-of-Attention Technique to the Identification of Potential Threat Regions in Carry-On Baggage Imagery,” Third International Aviation Security Technology Symposium, Atlantic City, New Jersey, 2001.

Karnowski, T. P., Tobin, K. W., Arrowood, L. F., Goddard, J. S., Ferrell, R. K., and Lakhani, F., “Field Test Results of an Image Retrieval System for Semiconductor Yield Learning,” Metrology-Based Control for Micro-Manufacturing, Proceedings of the SPIE, Vol. 4275, 2001, pp. 41-52.

Karnowski, T. P., Tobin, K. W., Ferrell, R. K., and Lakhani, F., “Content Based Image Retrieval for Semiconductor Manufacturing,” Machine Vision Applications in Industrial Inspection, Proceedings of SPIE, Vol. 3966, 2000, pp. 162-172, March 2000.

Tobin, K. W., Karnowski, T. P., and Ferrell, R. K., “Image Retrieval in the Industrial Environment,” Machine Vision Applications in Industrial Inspection VII, Proceedings of SPIE, Vol. 3652, January 1999, p. 184-192.

Jatko, W. B., Goddard, J. S., Gleason, S. S., and Ferrell, R. K., “Docking Related Technology Phase II Report,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM-12870, April 1995.

Goddard, J. S., Jatko, W. B., Ferrell, R. K., and Gleason, S. S., “Robust Determination for Autonomous Docking,” ANS 6th Topical Meeting on Robotics and Remote Systems, Monterey, California, February 1995.

Sitter, Jr., D. N., Goddard, J. S., and Ferrell, R. K., “Method for the Measurement of the Modulation Transfer Function of Sampled Imaging Systems from Bar-Target Patterns,” Applied Optics, Vol. 34, No. 4, pp. 746-751, 1995.