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Bingham, P. R., Price, J. R., Tobin, K. W. and Karnowski, T. P., “Semiconductor Sidewall Shape Estimation,” Journal of Electronic Imaging 13, 474 (2004).
Bingham, P. R., Tobin, K. W., Bennett, M. H., and Marmillion, P., “Phase Defect Detection with Spatial Heterodyne Interferometry,” SPIE 29 th Annual International Symposium on Microlithography, February 2004.
Bingham, P. R., Tobin, K. W., Bennett, M. H., and Marmillion, P., “Preliminary Results for Mask Metrology Using Spatial Heterodyne Interferometry,” 23rd annual BACUS Symposium on Photomask Technology, SPIE, Vol. 5256, pp. 1331-42, 2003.
Price, J. R., Bingham, P. R., Tobin, K. W., and Karnowski, T. P.,“Semiconductor Sidewall Estimation Using Top-Down Image Retrieval,” Sixth International Conference on Quality Control by Artificial Vision, SPIE, Vol. 5132, p. 209-219, May 2003.
Price, J. R., Hylton, K. W., Tobin, K. W., Bingham, P. R., Hunn, J. D., and Haines, J. R., “Detection of Cavitiation Pits on Steel Surfaces Using SEM Imagery,” Sixth International Conference on Quality Control by Artificial Vision, SPIE, Vol. 5132, p. 476-484, May 2003.
Thomas, Jr., C. E., Hunt, M. A., Bahm, T. M., Baylor, L. R., Bingham, P. R., Chidley, M. D., Dai, X., El-Khashab, A., Gilbert, J. M., Goddard, J. S., Hanson, G. R. , Hickson, J. D., Hylton, K. W., John, G. C., Jones, M. L., Mayo, M. W., Marek, C., Price, J. H., Rasmussen, D. A., Schaefer, L J., Schulze, M. A., Shen, B., Smith, R. G., Su, A. N., Tobin, K. W., Usry, W. R., Voelkl, E., and Weber, K. S., “Direct to Digital Holography for High Aspect Ratio Inspection of Semiconductor Wafers,” Presented at the 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, March 2003.
Price, J. R., Bingham, P. R., Tobin, K. W., and Karnowski, T. P., “Estimating Cross-Section Semiconductor Structure by Comparint Top-Down SEM Images,” Machine Vision Applications in Industrial Inspection XI, Proceedings of SPIE, Vol. 5011, March 2003.
Bingham, P. R., Price, J. R., Tobin, K. W., Karnowski, T. P., Bennett, M. H., Bogardus, H., and Bishop, M., “Sidewall Structure Estimation from CD-SEM for Lithographic Process Control,” Process and Materials Characterization and Diagnostics in IC Manufacturing II, SPIE, February 2003.
Thomas, Jr., C. E., Bahm, T. M., Baylor, L. R., Bingham, P. R., Burns, S. W., Chidley, M. D., Dai, X., Delahanty, R. J., Doti, C. J., El-Khashab, A., Fisher, R. L., Gilbert, J. M., Goddard, J. S., Hanson, G. R., Hickson, J. D., Hunt, M. A., Hylton, K. W., John, G. C., Jones, M. L., MacDonald, K. R., Mayo, M. W., MacMackin, I., Patek, D. R., Price, J. H., Rasmussen, D. A., Schaefer, L. J., Scheidt, T. R., Schulze, M. A., Schumaker, P. D., Shen, B., Smith, R. G., Su, A. N., Tobin, K. W., Usry, W. R., Voelkl, E., Weber, K. S., Jones, P. G., and Owen, R. W., “Direct to Digital Holography for Semiconductor Wafer Defect Detection and Review,” Proceedings of the Design, Process Integration, and Characterization for Microelectronics, SPIE Vol. 4692, pp. 180-194, March 2002.
Melton, R. W., Alford, C. O., Bingham, P. R., and Huang, T. C., “Relating Empirical Performance Data to Achievable Parallel Application Performance,” Proceedings of the International Conference on Parallel and Distributed Processing Techniques and Applications (PDPTA ’99), Vol. III, pp. 1627-1633, July, 1999.
Huang, T. C., Yalamanchili, S., Melton, R. W., Bingham, P. R., and Alford, C. O., “Teaching Pipelining and Concurrency Using Hardware Description Languages,” Proceedings 1999 IEEE International Conference on Microelectronic Systems Education (MSE ’99), pp. 55-56, July 1999.
Huang, T. C., Melton, R. W., Bingham, P. R., Wills, L., and Alford, C. O., “Active-Passive Deterministic Parallel System Specification Using Z,” Proceedings of the International Conference on Parallel and Distributed Processing Techniques and Applications (PDPTA ’99), Vol. IV, pp. 2027-2033, July 1999.
Bingham, P. R., Alford, C. O., Melton, R. W., and Huang, T. C., “Parallel Application Optimization via Network Models,” Proceedings of the International Conference on Parallel and Distributed Processing Techniques and Applications, Vol. IV, pp. 2252-2258, July 1999.
Huang, T. C., Melton, R. W., Alford, C. O., and Bingham, P. R., “TCP/UDP/IP Protocol Processing with a RISC Instruction Set,” Proceedings of the International Conference on Parallel and Distributed Processing Techniques and Applications, pp. 645-652, July 1998.
Bingham, P. R., Alford, C. O., Melton, R. W., and Huang, T. C., “Bandwidth of Fully Connected Switches Transferring Continuous Messages,” Proceedings of the International Conference on Parallel and Distributed Processing Techniques and Applications, pp. 1859-1862, July 1998.
Huang, T.C., Melton, R.W., Bingham, P.R., Alford, C.O., and Ghannadian, F., “The Teaching of VHDL in Computer Architecture,” 1997 IEEE International Conference on Microelectronic Systems Education (MSE ’97), pp. 133-134, July 1997. R.W. Melton, P.R. Bingham, C.O. Alford, and M.B. Woods, “A Transputer-Based Scalable, Parallel Global Climate Change Model,” Transputer Research and Applications Conference 7 (NATUG 7), pp. 60-67, October 1994.
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