Publications
2007
Ziock, K. P., Collins, J. W., Cunningham, M. F., Fabris, L., Gee, T. F., Goddard, J. S., Habte, F., and Karnowski, T. P., “The Use of Gamma-Ray Imaging to Improve Portal Monitor Performance,” Conference Record of the 2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, Honolulu, Hawaii, 2007.
Goddard, J. S., Baba, J., Weisenberger, A. G., and Smith, M. F., “Improved Pose Measurement and Tracking System for Motion Correction of Awake, Unrestrained Small Animal SPECT Imaging,” Conference Record of the 2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, Honolulu, Hawaii, 2007.
Bingham, P., Arrowood, L., and Gregor, J., “Calibration and Performance Testing for Reconfigurable Computed Ttomography Systems,” American Society for Nondesctructive Testing, Digital Imaging X, Mashantucket, Connecticut, July 30-August. 1, 2007.
Arrowood, L., Gregor, J., and Bingham, P., “Iterative Reconstruction Techniques for Industrial CT: Application and Performance,” American Society for Nondestructive Testing, Digital Imaging X, Mashantucket, Connecticut, July 30-August 1, 2007.
Raffo-Caiado, A. C., Tobin, K. W., and Fischer, D. M., “Satellite Image Analysis Capability for Safeguards Applications,” Proceedings of the Institute of Nuclear Materials Management 48th Annual Meeting, Tucson, Arizona, July 8-12, 2007.
Tobin, K. W., Chaum, E., Govindasamy, V. P., and Karnowski, T. P., “Detection of Anatomic Structures in Human Retinal Imagery,” IEEE Transactions on Medical Imaging 26(12), pp. 1729-1739, December 2007. (PDF Document)
Tobin, K. W., Bingham, P. R., and Price, J. R., “Optical Spatial Heterodyned Interferometry and Inspection of Micro-Electro-Mechanical Systems,” Proceedings of the 8th International Conference on Quality Control by Artificial Vision, SPIE Vol. 6356, Le Creusot, France, May 23-25, 2007.
Paquit, V., Price, J., Meriaudeau, F., Tobin, K., and Ferrell, R., “Combining Near-Infrared Illuminants to Optimize Venous Imaging,” Proceedings of the Medical Imaging Symposium, SPIE Vol. 6509, February 2007. (PDF Document)
Price, J., Bingham, P., and Thomas, Jr., C., “Improving Resolution in Microscopic Holography by Computationally Fusing Multiple, Obliquely-Illuminated Object Waves in the Fourier Domain,” Applied Optics 46(6), pp. 827-833, 2007. (PDF Document)
Price, J., Aykac, D., and Wall, J., “Improvements in Level Set Segmentation of 3D Small Animal Imagery,” Proceedings of Image Processing (SPIE's Medical Imaging Symposium), February 2007. (PDF Document)
Price, J., Aykac, D., Hunn, J., and Kercher, A., “Automatic Characterization of Cross-sectional Coated Particle Nuclear Fuel using Greedy Coupled Bayesian Snakes,” Proceedings of Machine Vision Applications in Industrial Inspection XV, (SPIE Electronic Imaging West Symposium), January 2007. (PDF Document)
2006
Bourgeat, P., Tobin, K. W., Gorria, P., and Meriaudeau, F., “Gabor Filtering for Feature Extraction on Complex Images: Application to Defect Detection on Semiconductors,” The Imaging Science Journal 54(4), pp. 200-210, December 2006.
Hausladen, P. A., Bingham, P. R., and Mullens, J. A., “Analytically Computed Small-Angle Scattering in Fast-Neutron Radiography,” Nuclear Science Symposium and Medical Imaging Conference, San Diego, California, October 31, 2006.
Mihalczo, J. T., Mullens, J. A., Hausladen, P. A., Bingham, P. R., Neal, J., Wright, M., and Archer, D., “Enhanced NMC&A by Imaging,” Proceedings of the Institute of Nuclear Materials Managers 47th Annual Meeting, July 2006.
Price, J., Aykac, D., and Wall, J., “A 3D Level Sets Method for Segmenting the Mouse Spleen and Follicles in Volumetric microCT Images,” Proceedings of the 2006 IEEE Engineering in Medicine and Biology Conference (EMBC), pp. 2332-2336, 2006. (PDF Document)
Price, J., Aykac, D., Hunn, J., Kercher, A., and Morris, R., “New Developments in Image-Based Characterization of Coated Particle Nuclear Fuel,” Proceedings of Machine Vision Applications in Industrial Inspection XIV, SPIE Vol. 6070, pp. 153-162, 2006. (PDF Document)
Gee, T. F., “On Asymmetric Classifier Training for Detector Cascades,” 2nd International Symposium on Visual Computing, LNCS 4292, Springer-Verlag, Berlin, 2006. (PDF Document)
Le Puil, M., Biggerstaff, J., Weidow, B., Price, J., Naser, S., White, D., and Alberte, R., “A Novel Fluorescence Imaging Technique Combining Deconvolution Microscopy and Spectral Analysis for Quantitative Detection of Opportunistic Pathogens,” Journal of Microbiological Methods 67(3), pp. 597-602, 2006. (PDF Document)
Goddard, J., Gee, T., Wang, H., and Gorbach, A., “Segmentation-Based Registration of Organs in Intraoperative Video Sequences,” International Symposium on Visual Computing, November 2006. (PDF Document)
Weisenberger, A. G., Kross, B., Majewski, S., Popov, V., Smith, M. F., Welch, B., Baba, J., Goddard, J., Pomper, M., and Tsui, B., “Instrumentation Development of a SPECT-CT System to Image Awake Mice,” Society of Molecular Imaging Conference, August 2006. (PDF Document)
Tobin, K. and Chaum E., “Automated Screening Aids Diagnosis of Diabetic Eye Disease,” Biomedical Optics & Medical Imaging, SPIE Newsroom (newsroom.spie.org), September 3, 2006. (PDF Document)
Tobin, K. W., Aykac, D., Govindasamy, V. P., Gleason, S. S., Gregor, J., Karnowski, T. P., Price, J. R., and Wall, J., “Image-Based Informatics for Preclinical Biomedical Research,” 2nd International Symposium on Visual Computing, LNCS 4292, Springer-Verlag, Berlin, 2006, pp. 1740-1750. (PDF Document)
Karnowski, T. P., Govindasamy, V. P., Tobin, K. W., and Chaum, E., “Locating the Optic Nerve in Retinal Images: Comparing Model-Based and Bayesian Decision Methods,” 28th Annual International Conf. of the IEEE EMBS, August 2006. (PDF Document)
Tobin, K. W., Bhaduri, B. L., Bright, E. A., Cheriyadat, A., Karnowski, T. P., Palathingal, P. J., Potok, T. E., and Price, J. R., “Automated Feature Generation in Large-Scale Geospatial Libraries for Content-Based Indexing,” Journal of Photogrammetric Engineering and Remote Sensing 72(5), May 2006. (PDF Document)
Tobin, K. W., Chaum, E., Govindasamy, V. P., Karnowski, T. P., and Sezer, O., “Characterization of the Optic Disk in Retinal Imagery using a Probabilistic Approach,” Proceedings of the International Symposium on Medical Imaging, San Diego, California, SPIE Vol. 6144, February 2006. (PDF Document)
Paquit, V., Price, J. R., Seulin, R., Meriaudeau, F., Farahi, R. R., Tobin, K. W., and Ferrell, T. L., “Near-Infrared Iimaging and Structured Light Ranging for Automatic Catheter Insertion,” Proceedings of the International Symposium on Medical Imaging, San Diego, California, SPIE Vol. 6141, February 2006. (PDF Document)
2005
Tobin, K. W., Bhaduri, B. L., Bright, E. A., Cheriyadat, A., Karnowski, T. P., Palathingal, P. J., Potok, T. E., and Price, J. R., “Large-Scale Geospatial Indexing for Image-Based Retrieval and Analysis,” ISVC 2005, LNCS 3804, Springer-Verlag, Berlin, 2005, pp. 543-552. (PDF Document)
Hausladen,P., Bingham, P.. Karnowski, T., Mullens, J., and Mihalczo, J., Development of a Tomographic Imaging System for HEU Components,” Presentation at the Fall 2005 INMM Central Region Chapter Meeting Conference: Challenges to Safeguards and Security, October 12, 2005.
Tobin, K. W. and Bingham, P. R., “Optical Spatial Heterodyned Interferometry for Applications in Semiconductor Inspection and Metrology,” (invited) Proceedings of the International Conference on Lasers, Applications, and Technologies, St. Petersburg, Russia, SPIE Vol. 6162, May 2005. (PDF Document)
Aykac, D., Price, J., and Wall, J., “3D Segmentation of the Mouse Spleen in microCT via Active Contours,” Proceedings of the IEEE Nuclear Science Symposium and Medical Imaging Conference, Vol. 3, pp. 1542-1545, 2005. Selected as “Premium Poster” (top 20 of 330). (PDF Document)
Kercher, A., Hunn, J., Price, J., Jellison, G., Montgomery, F., and Morris, R., “Advanced Characterization Methods for TRISO Fuels,” Proceedings of the Advanced Reactors with Innovative Fuels Workshop (ARWIF-2005), February 2005.
Simpson, M., Cheng, M.-D., Dam, T., Lenox, K., Price, J., and Storey, J., “Intensity-Modulated, Stepped Frequency CW LIDAR for Distributed Aerosol and Hard Target Measurements,” Applied Optics 44(33), pp. 7210-7217, November 2005. (PDF Document)
Price J. and Gee, T., “Face Recognition Using Direct, Weighted Linear Discriminant Analysis and Modular Subspaces,” Pattern Recognition 38(2), pp. 209-219, 2005. (PDF Document)
Tran, V.-H., Smith, M. F., Meikle, S. R., Welch, B. L., Goddard, J. S., Baba, J. S., and Weisenberger, A. G., “Geometry Calibration of a Dual Headed SPECT System, with Rocking Motion Correction, for Small Animal Imaging,” Proceedings of the IEEE Medical Imaging Conference, October 2005. (PDF Document)
Weisenberger, A. G., Kross, B., Gleason, S. S, Goddard, J., Majewski, S., Meikle, S. R., Paulus, M. J., Pomper, M., Popov, V., Smith, M. F., Welch, B. L., and Wojcik, R., “An Approach Towards a Restraint-Free Small Animal SPECT Imaging System with Motion Tracking,” IEEE Transaction on Nuclear Science 52(3), pp. 638-644, June 2005. (PDF Document)
Baba, J. S., Gleason, S. S., Goddard, J. S., and Paulus, M. J., “Application of Polarization for Optical Motion-Registered SPECT Functional Imaging of Tumors in Mice,” Proceedings of the International Symposium on Biomedical Optics, Optical Diagnostics and Sensing V, SPIE Vol. 5702, January 2005. (PDF Document)
Karnowski, T. P., Kercher, A. K., Hunn, J. D., and Maxey, L. C., “A Simple Optical System for Real-Time Size Measurements of TRISO Fuel Pellets,” Proceedings of Machine Vision Applications in Industrial Inspection XIII, SPIE Vol. 5679, February 2005, pp. 62-73. (PDF Document)
Kercher, A., Hunn, J., Price, J., Jellison, G., Montgomery, F., and Morris, R., “Advanced Characterization Methods for TRISO Fuels,” Proceedings of the Advanced Reactors with Innovative Fuels Workshop (ARWIF-2005), February 2005. (PDF Document)
Price, J. and Gee, T., “Face Recognition using Direct, Weighted Linear Discriminant Analysis and Modular Subspaces,” Pattern Recognition 38(2), pp. 209-219, 2005. (PDF Document)
Price, J., Aykac, D., Gleason, S., Chourey, K., and Liu, Y., “Quantitative Comparison of Mitotic Spindles by Confocal Image Analysis,” Journal of Biomedical Optics 10(4), 044012, July/August 2005. (PDF Document)
Weisenberger, A. G., Kross, B., Majewski, S., Popov, V., Smith, M. F., Welch, B., Wojcik, R., Goddard, J. S., Gleason, S. S., Paulus, M. J., Meikle, S. R., and Pomper, M., “A Small Animal SPECT Imaging System Utilizing Position Tracking of Un-anesthetized Mice,” Small Animal Spect Imaging; Springer USA, Chapter 18; pp. 239-243, 2005 (PDF Document)
2004
Chan, H.-Y., Sari-Sarraf, H., Grinstead, B. I., and Gleason, S. S., “Content-Based Compression of Mammograms with Customized Fractal Encoding and a Modified JPEG2000,” J. Optical Engineering 43, p. 2986, December 2004. (PDF Document)
Hunn, J., Jellison, G. E., and Price, J., “New Characterization Ttechniques for Coated Particle Fuel,” presented at the American Nuclear Society Winter Meeting, November 2004.
Price, J. and Hunn, J., “Optical Inspection of Coated Particle Nuclear Fuel,” Proceedings of Machine Vision Applications in Industrial Inspection XII, SPIE Vol. 5303, pp. 137-149, January 2004. (PDF Document)
Weisenberger, A. G., Baba, J. S., Kross, B., Gleason, S. S., Goddard, J., Majewski, S., Meikle, S. R., Paulus, M. J., Pomper, M., Popov, V., Smith, M. F., Welch, B. L., and Wojcik, R., “Dual Low Profile Detector Heads for a Restraint Free Small Animal SPECT Imaging System,” Proceedings of the IEEE Medical Imaging Conference, October 2004. (PDF Document)
Gleason, S. S., Goddard, J. S., Paulus, M. J., Baba, J. S., Majewski, S., Smith, M., Tran, T., Weisenberger, A., Welch, B., and Wojcik, R., “Real-Time, High-Accuracy 3 D Tracking of Small Animals for Motion-Corrected SPECT Imaging,” Proceedings of the IEEE Medical Imaging Conference, October 2004 . (PDF Document)
Mullens, J. A., Mihalczo, J. T., and Bingham, P. R., “Neutron and Gamma Ray Imaging for Nuclear Materials Identification,” Proceedings of the Institute of Nuclear Materials Managers 45th Annual Meeting, July 2004.
Bingham, P. R., Price, J. R., Tobin, K. W., and Karnowski, T. P., “Semiconductor Sidewall Shape Estimation,” Journal of Electronic Imaging 13(3), pp. 474-485, 2004. (PDF Document)
Gregor, J., Gleason, S., Kennel, S., Paulus, M., Solomon, A. , Hawkins, P., and Wall, J., “A MicroSPECT/CT System for Imaging of AA-Amyloidosis in Mice,” Small-Animal SPECT Imaging, Springer-Verlag, 209-213, 2004. (PDF Document)
Karnowski, T. P., Allard, L., Joy, D., and Clonts, L., “System Considerations for Maskless Lithography,” Proceedings of the Emerging Lithographic Techniques VIII, SPIE, Santa Clara, California, February 2004. (PDF Document)
Price, J. and Hunn, J., “Optical Inspection of Coated Particle Nuclear Fuel,” Proceedings of Machine Vision Applications in Industrial Inspection XII, SPIE Vol. 5303, 2004. (PDF Document)
Bingham, P. R., Tobin, K. W., Bennett, M. H., and Marmillion, P., “Phase Defect Detection with Spatial Heterodyne Interferometry,” Microlithography, Proceedings of the SPIE, Vol. 5378, May 2004. (PDF Document)
Bourgeat, P., Meriaudeau, F., Tobin, K. W., and Gorria, P., “Comparison of Texture Features for Segmentation of Pattern Wafers,” Journal Electronic Imaging, Vol. 13, 428 (2004); . (PDF Document)
2003
Bingham, P. R., Tobin, K. W., Bennett, M. H., and Marmillion, P., “Preliminary Results for Mask Metrology using Spatial Heterodyne Interferometry,” Proceedings of the 23rd Annual BACUS Symposium on Photomask Technology, SPIE Vol. 5256, pp. 1331-42, 2003. (PDF Document)
Price, J. R., Hylton, K. W., Tobin, K. W., Bingham, P. R., Hunn, J. D., and Haines, J. R., “Detection of Cavitiation Pits on Steel Surfaces Using SEM Imagery,” Proceedings of the Sixth International Conference on Quality Control by Artificial Vision, SPIE Vol. 5132, pp. 476-484, May 2003. (PDF Document)
Thomas, Jr., C. E., Hunt, M. A., Bahm, T. M., Baylor, L. R., Bingham, P. R., Chidley, M. D., Dai, X., El-Khashab, A., Gilbert, J. M., Goddard, J. S., Hanson, G. R. , Hickson, J. D., Hylton, K. W., John, G. C., Jones, M. L., Mayo, M. W., Marek, C., Price, J. H., Rasmussen, D. A., Schaefer, L J., Schulze, M. A., Shen, B., Smith, R. G., Su, A. N., Tobin, K. W., Usry, W. R., Voelkl, E., and Weber, K. S., “Direct to Digital Holography for High Aspect Ratio Inspection of Semiconductor Wafers,” Presented at the 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, March 2003. (PDF Document)
Price, J. R., Bingham, P. R., Tobin, K. W., and Karnowski, T. P., “Estimating Cross-Section Semiconductor Structure by Comparint Top-Down SEM Images,” Proceedings of Machine Vision Applications in Industrial Inspection XI, SPIE Vol. 5011, March 2003. (PDF Document)
Weisenberger, A. G., Kross, B., Majewski, S., Popov, V., Smith, M. F., Welch, B., Wojcik, R., Gleason, S., Goddard, J., Paulus, M., and Meikle, S. R., “Development and Testing of a Restraint Free Small Animal SPECT Imaging System with Infrared Based Motion Tracking,” Proceedings of IEEE Medical Imaging Conference, November 2003.
Goddard, J. S., Gleason, S. S., Paulus, M. J., Majewski, S., Popov, V., Smith, M., Weisenberger, A., Welch, B., and Wojcik, R. , “Pose Measurement and Tracking System for Motion-Correction of Unrestrained Small Animal PET/SPECT Imaging,” Proceedings of IEEE Medical Imaging Conference, November 2003.
Paulus, M., Gleason, S., Goddard, J., Kennel, S., Wall, J., Solomon, A., Gregor, J., and more, “Initial Results with a Small Animal microSPECT/CT Imaging System,” High-Resolution Molecular Imaging in Small Animals (IMI/HiRes), Madrid, Spain, September 2003.
Gleason, S., Goddard, J., Paulus, M., Kerekes, R., Weisenberger, A., Majewski, S., Smith, M., and Welch, B., “Automated Pose Determination for Unrestrained, Non-Anesthetized Small Animal Micro-SPECT and Micro-CT Imaging,” Proceedings of the Society of Molecular Imaging Conference, August 2003. (PDF Document)
Gregor, J., Gleason, S., and Paulus, M., “Conebeam X-ray Computed Tomography with an Offset Detector Array,” IEEE International Conference Image Proceedings, Barcelona, Spain, September 2003.
Kerekes, R. A., Goddard, J. S., Gleason, S. S., Paulus, M. J., Weisenberger, A. G., Smith, M. F., and Welch, B., “Two Methods for Tracking Small Animals in SPECT Imaging,” Proceedings of the Sixth International Conference on Quality Control by Artificial Vision, pp. 129-139, May 2003. (PDF Document)
Gregor, J., Benson, T., Gleason, S., and Paulus, M., “Support Algorithms for X-Ray Micro-CT Conebeam Imaging,” International Conference on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, Saint Malo, France, July 2003. (PDF Document)
Price, J., Bingham, P., Tobin, K., and Karnowski, T., “Semiconductor Sidewall Shape Estimation using Top-Down CD-SEM Image Retrieval,” Proceedings of the 6th International Conference on Quality Control by Artificial Vision, SPIE Vol. 5132, pp. 209-219, April 2003. (PDF Document)
Price, J., Bingham, P., Tobin, K., and Karnowski, T., “Estimating Cross-Section Semiconductor Structure by Comparing Top-Down SEM Images,” Proceedings of Machine Vision Applications in Industrial Inspection XI, SPIE Vol. 5011, pp. 161-170, January 2003. (PDF Document)
Bourgeat, P., Meriaudeau, F., Tobin, K. W., and Gorria, P., “Patterned Wafer Segmentation,” Proceedings of the IEEE/SME/SPIE 6th International Conference on Quality Control by Artificial Vision, SPIE Vol. 5132, May 2003. (PDF Document)
Bingham, P. R., Price, J. R., Tobin, K. W., Bennett, M., and Bogardus, H., “Sidewall Structure Estimation from CD-SEM for Lithographic Process Control,” Proceedings of Process and Materials Characterization and Diagnostics in IC Manufacturing II, SPIE Vol. 5041, May 2003. (PDF Document)
Bourgeat, P., Meriaudeau, F. Gorria, P., and Tobin, K. W., “Content-Based Segmentation of Patterned Wafers for Automatic Threshold Determination,” Proceedings of Machine Vision Applications of Industrial Inspection XI, SPIE Vol. 5011, March 2003.
Tucker, R. W., Kercel, S., and Varma, V. K., “Characterization of Gas Pipeline Flaws Using Wavelet Analysis,” Proceedings of IEEE/SME/SPIE 6th International Conference on Quality Control by Artificial Vision, SPIE Vol. 5132, May 2003. (PDF Document)
2002
Gee, T. F., Karnowski, T. P., Tobin, K. W., and Price, J. R., “Novel Software Architecture for Surveillance Video Processing,” Presented at the American Academy of Forensic Sciences Annual Meeting, February 2002. (PDF Document)
Thomas, Jr., C. E., Bahm, T. M., Baylor, L. R., Bingham, P. R., Burns, S. W., Chidley, M. D., Dai, X., Delahanty, R. J., Doti, C. J., El-Khashab, A., Fisher, R. L., Gilbert, J. M., Goddard, J. S., Hanson, G. R., Hickson, J. D., Hunt, M. A., Hylton, K. W., John, G. C., Jones, M. L., MacDonald, K. R., Mayo, M. W., MacMackin, I., Patek, D. R., Price, J. H., Rasmussen, D. A., Schaefer, L. J., Scheidt, T. R., Schulze, M. A., Schumaker, P. D., Shen, B., Smith, R. G., Su, A. N., Tobin, K. W., Usry, W. R., Voelkl, E., Weber, K. S., Jones, P. G., and Owen, R. W., “Direct to Digital Holography for Semiconductor Wafer Defect Detection and Review,” Proceedings of the Design, Process Integration, and Characterization for Microelectronics, SPIE Vol. 4692, pp. 180-194, March 2002. (PDF Document)
Gleason, S. S., Ferrell, R. K., Karnowski, T. P., and Tobin, K. W., “Detection of Semiconductor Defects Using A Novel Fractal Encoding Algorithm,” Proceedings of Design, Process Integration, and Diagnostics in IC Manufacturing, SPIE Vol. 4692, July 2002. (PDF Document)
Karnowski, T. P., Tobin, K. W., Ferrell, R. K., and Lakhani, F., “Using an Image Retrieval System for Image Data Management,” Proceedings of Design, Process Integration, and Diagnostics in IC Manufacturing, SPIE Vol. 4692, March 2002. (PDF Document)
Tobin, K. W., Karnowski, T. P., Arrowood, L. F., Ferrell, R. K., Goddard, J. S., and Lakhani, F., “Content-Based Image Retrieval for Semiconductor Process Characterization,” EURISP Journal on Applied Signal Processing, Special Issue on Applied Visual Inspection 2002(7), July 2002.
Gregor, J., Gleason, S., Paulus, M., and J. Cates, “Fast Feldkamp Reconstruction Based on Focus of Attention and Distributed Computing,” International Journal of Imaging Systems and Technology 12(6), pp. 229-234, 2002. (PDF document)
Weisenberger, A. G., Kross, B., Majewski, S., Popov, V., Smith, M. F., Welch, B., Wojcik, R., Paulus, M. J., Goddard, J. S., Gleason, S. S., Meikle, S. R., and Pomper, M., “Development of a Restraint Free Small Animal SPECT Imaging System,” Academy of Molecular Imaging Annual Conference, San Diego, California, October 2002.
Gleason, S., Sari-Sarraf, H., Abidi, M., Karakashian, O., and Morandi, F., “A New Deformable Model for Analysis of X-ray CT Images in Preclinical Studies of Mice for Polycystic Kidney Disease,” IEEE Transactions on Medical Imaging 21(10), October 2002. (PDF Document)
Goddard, J., Gleason, S., Kerekes, R., Paulus, M.. Weisenberger, A., Smith, M., Welch, B., and Wojcik, R. “Real-Time Landmark-Based Unrestrained Animal Tracking System for Motion-Corrected PET/SPECT Imaging,” Proceedings of the IEEE Medical Imaging Conference, November 2002. (PDF Document)
Dickens, M., Gleason, S., and Sari-Sarraf, H., “Volumetric Segmentation via 3D Active Shape Models,” Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation, pp. 248-252, Apr. 2002. (PDF Document)
Gleason, S., Sari-Sarraf, H., and Abidi, M., “Probabilistic Shape and Appearance Model for Scene Segmentation,” Proceedings of the IEEE International Conference on Robotics and Automation, May 2002. (PDF Document)
Weisenberger, A., Majewski, S., Smith, M., Meikle, S., Bradley, E., Welsh, R., Saha, M., Gleason, S., Paulus, M., Glover, D., Goode, A., and Williams, M., “High Resolution Detector Modules Based on High Granularity NAI(TL) Arrays Utilizing Optimized Collimator Designs Customized for Small Animal Single Photon Imaging,” Proceedings of the Society of Nuclear Medicine, June 2002.
Tobin, K. W., Lakhani, F., and Karnowski, T. P., “An Industry Survey of Automatic Defect Classification Technologies, Methods, and Performance,” Proceedings of Design, Process Integration, and Diagnostics in IC Manufacturing, SPIE Vol. 4692, March 2002. (PDF Document)
Tobin, K. W., Editorial Advisory Board for Engineering/Machine Vision (Joseph P. Hornak, Editor), The Encyclopedia of Imaging Science and Technology, Vol. 1-2, John Wiley & Sons, Inc., New York, 2002.
Weber, C., Sankaran, V., and Tobin, K.W., “Quantifying the Value of Ownership of Yield Analysis Technologies,” IEEE Transactions on Semiconductor Manufacturing 15(4), November 2002.
2001
Shin, J., Paik, J., Price, J., and Abidi, M., “Adaptive Regularized Image Interpolation Using Data Fusion and Steerable Constraints,” Proceedings of the Visual Comm., Image, SPIE Vol. 4310, pp. 798-809, 2001. (PDF Document)
Zhang, Y., Price, J., and Abidi, M., “Superquadrics-based Object Representation of Complex Scenes from Range Images,” Proceedings of Three-Dimensional Image Capture and Applications III, SPIE vol. 4298, pp. 56-67, January 2001. (PDF Document)
Gray, W., Price, J., Dumont, C., and Abidi, M., “Integration of Multiple Range and Intensity Image Pairs Using a Volumetric Method to Create Textured Three-Dimensional Models,” SPIE Journal of Electronic Imaging 10(1), pp. 252-262, January 2001. (PDF Document)
Gee, T. F. and Mersereau, R. M., “Model-Based Face Tracking for Dense Motion Field Estimation,” Proceedings of the 30th Applied Imagery and Pattern Recognition Workshop, pp. 149-153, October (2001). (PDF Document)
Ferrell, R.K. and Tobin, K. W, “Adaptation of a Focus-of-attention Technique to the Identification of Potential Threat Regions in Carry-on Baggage Imagery,” Third International Aviation Security Technology Symposium, Atlantic City, New Jersey, 2001. (PDF Document)
Karnowski, T. P., Tobin, K. W., Arrowood, L. F., Goddard, J. S., Ferrell, R. K., and Lakhani, F., “Field Test Results of an Image Retrieval System for Semiconductor Yield Learning,” Proceedings of Metrology-Based Control for Micro-manufacturing, SPIE Vol. 4275, 2001, pp. 41-52. (PDF Document)
Gleason, S., “Development of a Unified Probabilistic Framework for Segmentation and Recognition of Semi-Rigid Objects in Complex Backgrounds via Deformable Shape Models,” Ph.D. Dissertation, University of Tennessee, Knoxville, Tennessee, May 2001. (PDF Document)
Gleason, S., Sari-Sarraf, H., Dickens, M., Abidi, M., and Paulus, M., “Probabilistic Shape and Appearance Model for the Segmentation of Anatomic Structures within Tomographic Images of Laboratory Mice,” Proceedings of the High-Resolution Imaging of Small Animals Conference, Rockville, Maryland, September 2001. (PDF Document)
Paulus, M. and Gleason, S., “Issues in Animal Handling for Micro CT,” High-Resolution Imaging of Small Animals, September 2001.
Kruse, K., Williams, P. T., Mazer, A. K., Gleason, S. S., and Hammersly, J. R., Numerical Simulation of Airflow in a Realistic Porcine Airway Model,” Proceedings of the Biomedical Engineering Society's Conference, Durham, North Carolina, October 2001.
Kruse, K., Williams, P., Allgood, G., Ward, R., Gleason, S., Paulus, M., Munro, N., Mahinthakumar, G., Narasimhan, C., Hammersley, J., and Olson, D., “Flow Simulation in a 3-D Model of Pig Airways and Connection to Lung Sounds,” Proceedings of Visualization of Temporal and Spatial Data for Civilian and Defense Applications," SPIE Vol. 4368 pp 168-176, 2001.
Dickens, M., Sari-Sarraf, H., and Gleason, S., “A Streamlined Volumetric Landmark Placement Method for Building Three-Dimensional Active Shape Models,” Proceedings of Medical Imaging 2001: Image Processing, SPIE, San Diego, California, February 2001.
Paulus, M., Gleason, S., Easterly, M., and C. Foltz, “A Review of High-Resolution X-ray Computed Tomography and Other Imaging Modalities for Small Animal Research,” Lab Animal 30(3), 2001, 36-45.
Grinstead, B., Sari-Sarraf, H., Gleason, S., and Mitra, S., “Preliminary Validation of Content-Based Compression of Mammographic Images,” Proceedings of the Medical Imaging: Image Processing, SPIE, San Diego, California, pp. 1179-1190, February 2001. (PDF Document)
Goddard, J. S., “Four-Dimensional Characterization of Paper Web at the Wet End,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM 2000/ 387, January 2001. (PDF Document)
Tobin, K. W. and Karnowski, T. P., “Revolutionizing Defect Image Management,” SPIE's OE Magazine 1(7), July 2001.
Tobin, K. W., Karnowski, T. P., Arrowood, L. F., and Lakhani, F., “Field Test Results of an Automated Image Retrieval System,” 12th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, Munich, Germany, April 23-24, 2001. (PDF Document)
Tobin, K. W., Karnowski, T. P., and Lakhani, F., “Integrated Applications of Inspection Data in the Semiconductor Manufacturing Environment,” Proceedings of Metrology-Based Control for Micro-manufacturing, SPIE Vol. 4275, 2001, pp. 31-40. (PDF Document)
Price, J. and Gee, T., “Towards Robust Face Recognition from Video,” Proceedings of the 30th Applied Imagery and Pattern Recognition Workshop, pp. 94-100, October 2001. (PDF Document)
Price, J., Gee, T., and Tobin, K., “Blur Estimation in Limited-Control Environments,” Proceedings of the 2001 IEEE International Conference on Acoustics, Speech, and Signal Processing (ICASSP), Vol. 3, pp 1669-1672, May 2001. (PDF Document)
Zhang, Y., Price, J., and Abidi, M., “Superquadrics-Based Object Representation of Complex Scenes from Range Images,” Proceedings of Three-Dimensional Image Capture and Applications IV, SPIE Vol. 4298, pp. 56-67, January 2001. (PDF Document)
Tobin, K. W. and Neiberg, L., “Metrology Data Management and Information Systems,” (Alain C. Diebold, Editor) Handbook of Silicon Semiconductor Metrology, Alain Diebold, Editor, Marcel Dekker, Inc., New York, New York, 2001.
Tobin, K. W., Bingham, P. R., Price, J. R., and Bennett, M. H., “An Application of Image Retrieval Technology to Sidewall Structure Estimation from Top-Down SEM Imagery,” SCANNING, The Journal of Scanning Microscopies 23(2), March/April 2001.
2000
Sun, Y., Paik, J., Price, J., and Abidi, M., “Dense Range Image Smoothing using Adaptive Regularization,” Proceedings of the 7th IEEE International Conference on Image Processing (ICIP2000), Vol. 2, pp. 744-747, September 2000. (PDF Document)
Price, J. and Rabbani, M., “Dequantization Bias for JPEG Decompression,” Proceedings of the International Conference on Information Technology: Coding and Computing (ITCC 2000), pp. 30-35, March 2000. (PDF Document)
Karnowski, T. P., Tobin, K. W., Ferrell, R. K., and Lakhani, F., “Content Based Image Retrieval for Semiconductor Manufacturing,” Proceedings of Machine Vision Applications in Industrial Inspection,SPIE Vol. 3966, 2000, pp. 162-172, March 2000. (PDF Document)
Karnowski, T., Gleason, S., and Tobin, K., “Fuzzy Logic Connectivity in Semiconductor Defect Clustering,” SME Technical Paper MS00-240, Dearborn, Michigan, Society of Manufacturing Engineers, 2000. (PDF Document)
Grinstead, B., Sari-Sarraf, H., Gleason, S., and Mitra, S., “Content-Based Compression of Mammograms for Telecommunication and Archiving,” Proceedings of the 13th IEEE Sym. on Computer Based Medical Systems, 2000. (PDF Document)
Gleason, S., Sari-Sarraf, H., Paulus, M., Johnson, D., and Abidi, M., “Automatic Screening of Polycystic Kidney Disease in X-ray CT Images of Llaboratory Mice,” Proceedings of the Medical Imaging 2000: Image Processing, SPIE Vol. 3979, pp. 837-846, February 2000. (PDF Document)
Gleason, S., Sari-Sarraf, H., Paulus, M., Johnson, D., and Abidi, M., “Statistical-Based Deformable Models with Simultaneous Optimization of Object Gray-Level and Shape Characteristics,” Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation, pp.93-95, April 2000. (PDF Document)
Paulus, M., Gleason, S., Sari-Sarraf, H., Johnson, D., Foltz, C., Austin, D., Easterly, M., Michaud, E., Dhar, M., Hunsicker, P., Wall, J., and Schell, M., “High-Resolution X-ray CT Screening of Mutant Mouse Models,” Proceedings of SPIE, Vol. 3921, pp. 270-279, 2000.
Paulus, M., Gleason, S., Kennel, S., Hunsicker, P., and Johnson, D., “High Resolution X-ray Computed Tomography: An Emerging Tool for Small Animal Cancer Research,” Neoplasia 2(1), 62-70, 2000.
Sari-Sarraf, H., Goddard, J. S., Abidi, B. R., and Hunt, M. A., “Vision System for On-Line Characterization of Paper Slurry,” International Journal of Imaging Systems and Technology 11(4), pp. 231- 242, 2000.
Hunt, M. A., Goddard, Jr., J. S., Ferrell, R. K., Mullens, J. A., and Whitus, B. R., Oak Ridge National Laboratory; A. Ben-Porath, Applied Materials (Israel), “Hierarchical-Based Multiple Classifier System for Automatic Defect Classification,” Proceedings of Metrology, Inspection, and Process Control for Microlithography XIV, SPIE, February 2000.
Tobin, Jr., K.W., Hunt, M. A., Goddard, Jr., J. S., Hylton, K. W., Richards, R. K., Simpson, M. L., and Treece, D. A., “Accommodating Multiple Illumination Sources in an Imaging Colorimetry Environment,” Proceedings of Machine Vision Applications in Industrial Inspection VIII, SPIE Vol. 3966, January 2000. (PDF Document)
Tobin, K. W., Karnowski, T. P., and Lakhani, F., “Technology Considerations for Future Semiconductor Data Management Systems,” Semiconductor Fabtech, Vol. 12, ICG Publishing, Ltd., London, England, Spring 2000.
Tobin, K. W., Karnowski, T. P., and Lakhani, F., “Managing Defect Image Databases for Semiconductor Yield Monitoring and Control,” Global Semiconductor, Sterling Publications, London, England, February 2000.
Tobin, K. W., Karnowski, T. P., and Lakhani, F., “The Use of Historical Defect Imagery for Yield Learning,” The 11th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, Fairmont Copley Plaza Hotel, Boston, Massachusetts, September 12-14, 2000.
Tobin, K. W., Karnowski, T. P., and Lakhani, F., “A Survey of Semiconductor Data Management Systems Technology,” Proceedings of Metrology, Inspection, and Process Control for Microlithogrpahy, SPIE Vol. 3998, pp. 248-257, June 2000.
Gee, T. F., Karnowski, T. P., and Tobin, K. W., “Multiframe Combination and Blur Deconvolution of Video Data,” IS&T/SPIE's 12th International Symposium on Electronic Imaging: Science and Technology, San Jose Convention Center, January 2000. (PDF Document)
Sun, Y., Paik, J., Price, J., and Abidi, M., “Dense Range Image Smoothing using Adaptive Regularization,” Proceedings of the 7th IEEE International Conference on Image Processing (ICIP2000), Vol. 2, pp. 744-747, September 2000. (PDF Document)
Price, J. and Rabbani, M., “Dequantization Bias for JPEG Decompression,” Proceedings of the International Conference on Information Technology: Coding and Computing (ITCC 2000), pp. 30-35, March 2000. (PDF Document)
Jensen, D., Long, C., Worley, R, Lakhani, F., and Tobin, K., “Comparing the Defect Reduction Sections of the Most Recent Versions of the Roadmap,” Micro, Canon Communications, LLC, Los Angeles, California, January 2000.
Damiano, B., Kercel, S. W., Tucker, Jr., R. W., and Brown-VanHoozier, S. A., “Recognizing a Voice from Its Model,” Proceedings of the 2000 IEEE International Conference on Systems, Man, and Cybernetics, October 2000.
1999
Price, J. and Hayes, III, M., “Sensor Optimal Image Interpolation,” Proceedings of the Thirty-Third Asilomar Conference on Signals, Systems, and Computers, Vol. 2, pp. 1262-1266, October 1999. (PDF Document)
Price, J. and Hayes, III, M., “Steerable Filter Cascades,” Proceedings of the 6th IEEE International Conference on Image Processing (ICIP'99), Vol. 2, pp. 880-884, October 1999. (PDF Document)
Tobin, K. W., Karnowski, T. P., and Ferrell, R. K., “Image Retrieval in the Industrial Environment,” Proceedings of Machine Vision Applications in Industrial Inspection VII, SPIE Vol. 3652, p. 184-192, January 1999.
Price, J. and Rabbani, M., “Biased Reconstruction for JPEG Decoding,” IEEE Signal Processing Letters, Vol. 6, No. 12, pp. 297-299, December 1999. (PDF Document)
Gleason, S., Sari-Sarraf, H., Paulus, M., Johnson, D., and Abidi, M., “Statistical-Based Deformable Models for Image Segmentation: An Application to X-ray Micro-CT Images of Laboratory Mice,” Proceedings of the International Workshop on Anatomical Models, September 1999. (PDF Document)
Gleason, S., Sari-Sarraf, H., Paulus, M., Johnson, D., Norton, S., and Abidi, M., “Reconstruction of Multi-Energy, X-ray Computed Tomography Images of Laboratory Mice,” IEEE Transactions on Nuclear Science 46(4), pt. 2, pp. 1081-6, August 1999. (PDF Document)
Paulus, M., Sari-Sarraf, H., Gleason, S., Bobrek, M., Hicks, J., Johnson, D., Behel, J., and Thompson, L., “A New X-ray Computed Tomography System for Laboratory Mouse Iimaging,” IEEE Transactions on Nuclear Science 46(3), pt. 2, pp. 558-64, June 1999.
Gleason, S., Sari-Sarraf, H., Paulus, M., Johnson, D., and Abidi, M., “Deformable Model-based X-ray CT Image Segmentation for Automatic Phenotype Identification in Laboratory Mice,” Second Tennessee Conference on Biomedical Engineering, Vanderbilt University, Nashville, Tennessee, April 1999. (PDF Document)
Sari-Sarraf, H., Gleason, S. S., and Nishikawa, R. M., “Front-End Data Reduction in Computer-Aided Diagnosis of Mammograms: A Pilot Study,” Proceedings of Medical Imaging 1999: Image Processing, San Diego, California, SPIE Vol. 3661, pp. 1536-1543, February 1999. (PDF Document)
Tobin, K., Karnowski, T., Gleason, S., Jensen, D., and Lakhani, F., “Integrated Yield Management,” 196th Meeting of the Electrochemical Society, Inc., October 17-22, Honolulu, Hawaii, 1999.
Tobin, K., Karnowski, T., Gleason, S., Jensen, D., and Lakhani, F., “Using Historical Wafermap Data for Automated Yield Analysis," Journal of Vacuum Science Technology, Summer, 1999.
Abidi, B. R., Sari-Sarraf, H., Goddard, J. S., and Hunt, M. A., “Facet Model and Mathematical Morphology for Surface Characterization,” Proceedings of Intelligent Robots and Computer Vision XVIII: Algorithms, Techniques, and Active Vision, SPIE, Vol. 3837, September 1999. (PDF Document)
Sari-Sarraf, H. and Goddard, J. S., “Vision System for On-Loom Fabric Inspection,” IEEE Transactions on Industry Applications, November/December 1999. (PDF Document)
Goddard, J. S., Sari-Sarraf, H., Turner, J. C., Hunt, M. A., and Abidi, B. R., “Depth Measurement of Moving Slurry at the Wet End of a Paper Machine,” Proceedings of Machine Vision Applications in Industrial Inspection VII, SPIE Vol. 3652, January 1999. (PDF Document)
Hunt, M. A., Goddard, J. S., Hylton, K. W., Karnowski, T. P., Simpson, M. L., Tobin, Jr., K. W., and Treece, D. A., “Tristimulus Color Measurement of Printed Textile Patterns Using the POCS Algorithm,” Proceedings of Machine Vision Applications in Industrial Inspection VII, SPIE Vol. 3652, January 1999.
Karnowski, T. P., Tobin, K. W., Jensen, D., and Lakhani, F., “The Application of Spatial Signature Analysis to Electrical Test Data: Validation Study,” Proceedings of Metrology, Inspection, and Process Control for Microlithography XII, SPIE Vol. 3677, 1999, pp. 530-541. (PDF Document)
Price, J. and Rabbani, M., “Biased Reconstruction for JPEG Decoding,” IEEE Signal Processing Letters, Vol. 6, No. 12, pp. 297-299, December 1999. (PDF Document)
Price, J. and Hayes, III, M., “Sensor Optimal Image Interpolation,” Proceedings of the Thirty-Second Asilomar Conference on Signals, Systems, and Computers, Vol. 2, pp. 1262-1266, October 1999. (PDF Document)
Price, J. and Hayes, III, M., “Steerable Filter Cascades,” Proceedings of the 6th IEEE International Conference on Image Processing (ICIP’99), Vol. 2, pp. 880-884, October 1999. (PDF Document)
Sankaran, V., Weber, C. M., Tobin, K. W, Jr., and Lakhani, F., “Inspection in Semiconductor Manufacturing,” Webster's Encyclopedia of Electrical and Electronic Engineering, Vol. 10, pp. 242-262, Wiley & Sons, New York, New York, 1999.
Kercel, S. W., Tucker, Jr., R. W., and Brown-VanHoozer, S. A., “Speaker Recognition Through NLP and CWT Modeling,” 15th Annual Security Technology Symposium and Exhibition, June 1999. (PDF Document)
Damiano, B., Breeding, J. E., and Tucker, Jr., R. W., “Machine and Process System Diagnostics Using One-Step Predictor Maps,” International Conference on Maintenance and Reliability, May 1999. (PDF Document)
1998
Tobin, K. W., Goddard, J. S., and Thomas, C. E., “Defect Detection and Analysis on Direct-to-Digital Holographic Imagery,” Technology Transfer 98123641 A-TR, SEMATECH, Austin, Texas, December 1998.
Price, J. and Hayes, III, M. “Resampling and Reconstruction with Fractal Interpolation Functions,” IEEE Signal Processing Letters, Vol. 5, No. 9, pp. 228-230, September 1998. (PDF Document)
Sari-Sarraf, H., Goddard, J. S., Turner, J. C., Hunt, M. A., and Abidi, B. R., “On-Line Characterization of Slurry for Monitoring Headbox Performance,” TAPPI Process & Product Quality Conference, Milwaukee, Wisconsin, October 1998.
Sari-Sarraf, H. and Goddard, J. S., “Robust Defect Segmentation in Woven Fabrics,” IEEE Conference on Computer Vision and Pattern Recognition, Santa Barbara, California, June 1998. (PDF Document)
Goddard, J. S., “Pose and Motion Estimation Using Dual Quaternion-Based Extended Kalman Filtering,” Proceedings of Three-Dimensional Image Capture and Applications, SPIE Vol. 3313, January 1998.
Patek, D. R., Goddard, J. S., and Karnowski, T., “Rule-Based Inspection of Printed Green Ceramic Tape,” Proceedings of Machine Vision Applications in Industrial Inspection VI, SPIE Vol. 3306, January 1998.
Tobin, K. W., Gleason, S. S., Karnowski, T. P., and Bennett, M. H., “Semiconductor Defect Data Reduction for Process Automation and Characterization,” Journal of Process and Analytical Chemistry 3(3,4), Spring 1998.
Tobin, K. W., Gleason, S. S., Karnowski, T. P., and Guidry, D., “Using SSA to Measure the Efficacy of Automated Defect Data Gathering,” Micro, Canon Communications, LLC, Los Angeles, California, April 1998.
Gleason, S. S., Tobin, K. W., and Karnowski, T. P., “Rapid Yield Learning Through Optical Defect and Electrical Test Analysis," Proceedings of SPIE's Metrology, Inspection, and Process Control for Microlithography XII, Santa Clara Convention Center, February 1998.
Tobin, K. W., Gleason, S. S., and Karnowski, T. P., “Adaptation of the Fuzzy K–Nearest Neighbor Classifier for Manufacturing Automation,” Proceedings of the Machine Vision Applications in Industrial Inspection VI, SPIE Vol. 3306, 1998, pp. 122-130.
Price, J. and Hayes, III, M., “Fractal Interpolation of Images and Volumes,” Proceedings of the Thirty-Second Asilomar Conference on Signals, Systems, and Computers, Vol. 2, pp. 1698-1702, November 1998. (PDF Document)
Price, J. and Hayes, III, M., “Optimal Prefiltering for Improved Image Interpolation,” Proceedings of the Thirty-Second Asilomar Conference on Signals, Systems, and Computers, Vol. 2, pp. 959-963, November 1998. (PDF Document)
Price, J. and Hayes, III, M., “Resampling and Reconstruction with Fractal Interpolation Functions,” IEEE Signal Processing Letters, Vol. 5, No. 9, pp. 228-230, September 1998. (PDF Document)
Tobin, K. W., Goddard, J. S., and Thomas, C. E., “Defect Detection and Analysis on Direct-to-Digital Holographic Imagery,” Technology Transfer 98123641 A-TR, SEMATECH, Austin, Texas, December 1998.
Tobin, K. W., Gleason, S. S., Karnowski, T. P., and Guidry, D., “Using SSA to Measure the Efficacy of Automated Defect Data Gathering,” Micro, Canon Communications, LLC, Los Angeles, California, April 1998.
1997
Sari-Sarraf H. and Goddard, J. S., “Four Dimensional Characterization of Paper Web at Wet End,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM- 13528, October 1997. (PDF Document)
Gleason, S. S., Tobin, K. W., and Karnowski, T. P., “An Integrated Spatial Signature Analysis and Automatic Defect Classification System,” 191st Meeting of the Electrochemical Society, Inc., May 1997. (PDF Document)
Tobin, K. W., Gleason, S. S., Karnowski, T. P., Cohen, S. L., and Lakhani, F., “Automatic Classification of Spatial Signatures on Semiconductor Wafermaps,” Proceedings of Metrology, Inspection, and Process Control for Microlithography XI, SPIE Vol. 3050, p. 434-444, July, 1997.
Tobin, K. W., Gleason, S. S., Karnowski, T. P., and Cohen, S. L., “Feature Analysis and Classification of Manufacturing Signatures on Semiconductor Wafers,” Proceedings of Machine Vision Applications in Industrial Inspection V, SPIE Vol. 3029, p. 14-25, April 1997.
1996
Sari-Sarraf, H. and Goddard, J. S., “On-line Optical Measurement and Monitoring of Yarn Density in Woven Fabrics,” Photonics China '96 Symposium on Automated Optical Inspection for Industry: Theory, Technology, and Application, Beijing, China, pp. 444-452, November 1996. (PDF Document)
Hunt, M. A., Gleason, S. S., Goddard, J. S., Karnowski, T. P., Sari-Sarraf, H., Sitter, D. N., and Tobin, K. W., “Sort Floor Optical Inspection Tool: A Feasibility Study,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM- 5302, September 1996.
Jatko, W. B., Goddard, J. S., Ferrell, R. K., Gleason, S. S., Hicks, J. S., and Varma, K., “Crusader Automated Docking System Phase III Report,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM- 13177, March 1996. (PDF Document)
Tobin, K. W., Gleason, S. S., Karnowski, T. P., and Bennett, M. H., “Image Paradigm for Semiconductor Defect Data Reduction,” Proceedings of Metrology, Inspection, and Process Control for Microlithography X, SPIE, Vol. 2725, p. 194-205, May 1996.
Gleason, S. S., Tobin, K. W., and Karnowski, T. P., “Spatial Signature Analysis of Semiconductor Defects for Manufacturing Problem Diagnosis,” Solid State Technology, PennWell Corp., Tulsa, Oklahoma, July 1996.
1995
Jatko, W. B., Goddard, J. S., Gleason, S. S., and Ferrell, R. K., “Docking Related Technology Phase II Report,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM-12870, April 1995. (PDF Document)
Goddard, J. S., Jatko, W. B., Ferrell, R. K., and Gleason, S. S., “Robust Determination for Autonomous Docking,” ANS 6th Topical Meeting on Robotics and Remote Systems, Monterey, California, February 1995. (PDF Document)
Sitter, Jr., D. N., Goddard, J. S., and Ferrell, R. K., “Method for the Measurement of the Modulation Transfer Function of Sampled Imaging Systems from Bar-Target Patterns,” Applied Optics 34(4), pp. 746-751, 1995.
Tobin, K. W., Allen, D. B., Goddard, J. S., Jones, J. P., Sitter, D. N., Tapp, E. R., and Turner, J. C., “RGB Field System Data Collection and Testing for Textile Print Finishing,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM- 13097, September 1995.
Breeding, J. E. and Karnowski, T. P., “A Method for Efficient Fractional Sample Delay Generation for Real-Time Frequency-Domain Beamformers,” presented at The International Conference on Signal Processing Applications and Technology, Boston, Massachusetts, 1995. (PDF Document)
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