Publication Instructions for the 21st SOFE Papers

 

Papers will be published as IEEE/SOFE05 proceedings on CD-ROM only; there will be no printed copy. They will also be included in the IEEE Xplore database, and so will be accessible online. An abstract booklet will be distributed at the meeting and will also be available online.

Paper submission will be done completely online using the IEEE Website: http://www.ieee.org/organizations/pubs/confpub/sofe05/authors/

Templates and instructions for manuscript preparation and submission are on this website. There is also a link for online submission of a copyright form on this page. The copyright form MUST be submitted before your paper can be accepted.

IMPORTANT: DO NOT SUBMIT PDF or POSTSCRIPT FILES! You will be submitting your original source files for conversion to PDF. The PDFs used in production of the proceedings must adhere to a certain set of specifications set by IEEE, and the way to assure this is for IEEE to generate the PDF files from your original source file.

The file types that may be submitted are:
            Rich Text Format
            Freelance (La)
            TeX (DVI and all support files required)
            Pagemaker
            FrameMaker
            QuarkXpress
            Word Pro
            Microsoft Word
            WordPerfect

After your file is submitted, IEEE will email you a PDF file for your review and correction. Please see the website above for more information.

Please be sure to USE TEMPLATES FOR THIS CONFERENCE. The format has changed, so don't use templates from prior conferences. Make sure you use the templates from this website when writing your paper. Since the IEEE SOFE papers will not be peer reviewed, it is extremely important that you follow the recommended format for publication uniformity.

PAGE LIMITS:
                        Contributed papers - four 8-1/2 x 11 in. (or A4) pages.
                        Invited papers - six 8-1/2 x 11 in. (or A4) pages.
    There will be a
$100 charge for each page over the limit.

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