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Research Areas

  • Biomedical Imaging
  • Industrial Inspection
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Industrial Inspection Research

Fusion of scanning electron microscopy imagery for structural and material characterization.

Factsheets

Automatic Defect Classification for Semiconductor Wafer Inspection and Review

Digital Holographic Microscopy for 3-D Optical Metrology with Real-time, Full-field, Nanometer Resolution

Computed Tomography (CT) for Industrial Components

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Oak Ridge National Laboratory is a national multi-program research and development facility managed by UT-Battelle, LLC for the U.S. Department of Energy

Events

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News

June 2009

Optics—Boost for biology ...

March 2009

ORNL, St. Jude track neurons to predict and prevent disease

News Archive

This news insert contains our monthly activites for the current year. Pleae visit our ISMV News and Events Archive for older topics.

Highlights for 2008
Highlights for 2007
Highlights for 2006
Highlights for 2005
Highlights for 2004