Curriculum Vita
Dr. James S. Goddard, Jr.
P.O. Box 2008, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6075
Wk: (865) 574-9034, Fax: (865) 576-8993
E-mail: goddardjsjr@ornl.gov
Experience
Dr. James Goddard is a Senior Research and Development Engineer in the Imaging, Signals, and Machine Learning (ISML) Group at Oak Ridge National Laboratory. He joined ISML in 1991. His research areas of interest include image based 3-D measurement, defect detection, and image acquisition methods. Algorithms and systems have been developed for forensic, semiconductor manufacturing, medical imaging, and robotics applications. Software development experience includes Matlab, C++, and Java.
Education
| Ph.D. | Electrical Engineering, University of Tennessee, Knoxville, Tennessee, 1997 |
| M.S. | Electrical Engineering, University of Maryland, College Park, Maryland, 1974 |
| B.S. | Electrical Engineering, Georgia Tech, Altanta, Georgia, 1971 |
Issued and Pending Patents
“Four-Dimensional Characterization of a Sheet-Forming Web,” U.S. Patent No. 6,553,133, April 22, 2003.
Recent Awards
ORNL significant event award was given to the project team in 2003 for development of a stereo-based animal tracking system for ORNL's mouse genetics program.
Excellence in Technology Transfer award was presented by the Federal Laboratory Consortium to the project team in 2002 for "Direct to Digital Holography for High-Speed, High Resolution Defect Inspection."
Selected Publications
Weisenberger, A. G., Kross, B., Majewski, S., Popov, V., Smith, M. F., Welch, B., Wojcik, R., Goddard, J. S., Gleason, S. S., Paulus, M. J., Meikle, S. R., and Pomper, M., “A Small Animal SPECT Imaging System Utilizing Position Tracking of Un-Anesthetized Mice,” NIBIB Workshop on Small-Animal SPECT, University of Arizona, January 2004.
Weisenberger, A. G., Kross, B., Majewski, S., Popov, V., Smith, M. F., Welch, B., Wojcik, R., Gleason, S., Goddard, J., Paulus, M., and Meikle, S.R., “Development and Testing of a Restraint Free Small Animal SPECT Imaging System with Infrared Based Motion Tracking,” Proceedings of the IEEE Medical Imaging Conference, November 2003.
Goddard, J., Gleason, S., Paulus, M., Kerekes, R., Majewski, S., Popov, V., Smith, M., Weisenberger, A., Welch, B., and Wojcik, R., “Pose Measurement and Tracking System for Motion-Correction of Unrestrained Small Animal PET/SPECT Imaging,” Proceedings of the IEEE Medical Imaging Conference, October 2003.
Kerekes, R. A., Goddard, J. S., Gleason, S. S., Paulus, M. J., Weisenberger, A. G., Smith, M. F., and Welch, B., “Two Methods for Tracking Small Animals in SPECT Imaging,” Proceedings of SPIE: 6th International Conference on Quality Control by Artificial Vision, May 2003. (PDF Document)
Thomas, Jr., C. E., Hunt, M. A., Bahm, T. M., Baylor, L. R., Bingham, P. R., Chidley, M. D., Dai, X., Delahanty, R. J., El-Khashab, A., Gilbert, J. M., Goddard, J. S., Hanson, G. R., Hickson, J. D., Hylton, K. W., John, G. C., Jones, M. L. , Mayo, M. W., Marek, C., Price, J. H., Rasmussen, D. A., Schaefer, L. J., Schulze, M. A., Shen, B., Smith, R. G., Su, A. N., Tobin, K. W. , Usry, W. R., Voelkl, E., Weber, K. S., and Owen, R. W., “Direct To Digital Holography for High Aspect Ratio Inspection of Semiconductor Wafers,” ULSI Metrology Conference Invited Paper, Austin, Texas, March 2003. (PDF Document)
Paulus, M., Gleason, S., Goddard, J., Kennel, S., Wall, J., Solomon, A., Gregor, J., and more, “Initial Results with a Small Animal MicroSPECT/CT Imaging System,” High-Resolution Molecular Imaging in Small Animals (IMI/HiRes), Madrid, Spain, September 2003.
Gleason, S., Goddard, J., Paulus, M., Kerekes, R., Weisenberger, A., Majewski, S., Smith, M., and Welch, B., “Automated Pose Determination for Unrestrained, Non-Anesthetized Small Animal Micro-SPECT and Micro-CT Imaging,” Proceedings of the Society of Molecular Imaging Conference, August 2003. (PDF Document)
Kerekes, R. A., Goddard, J. S., Gleason, S. S., Paulus, M. J., Weisenberger, A. G., Smith, M. F., and Welch, B., “Two Methods for Tracking Small Animals in SPECT Imaging,” Proceedings of Quality Control by Articial Vision, May 2003. (PDF Document)
Goddard, J., Gleason, S., Kerekes, R., Paulus, M., Weisenberger, A., Smith, M., Welch, B., and Wojcik, R., "Real-Time Landmark-Based Unrestrained Animal Tracking System for Motion-Corrected PET/SPECT Imaging," Proceedings of the IEEE Medical Imaging Conference, November 2002. (PDF Document)
Tobin, K. W., Karnowski, T. P., Arrowood, L. F., Ferrell, R. K., Goddard, J. S., Lakhani, F., “Content-Based Image Retrieval for Semiconductor Process Characterization,” EURISP Journal on Applied Signal Processing, Special Issue on Applied Visual Inspection 2002(7), July 2002.
Thomas, Jr., C. E., Bahm, T., Burns, S., Dai, L., Delahanty, R., Doti, C., El-Khashab, A., Fisher, R., Gilbert, J., Hickson, J., Hunt, M., John, G., Jones, M., Macdonald, K., Mayo, M., McMackin, I., Price, J., Schaefer, L., Scheidt, T., Schulze, M., Schumaker, P., Shen, B., Smith, R., Su, A., Voelkl, E., Weber, K., Baylor, L., Bingham, P., Chidley, M., Goddard, J., Hanson, G., Hylton, K., Patek, D., Rasmussen, D., Tobin, K., “Direct To Digital Holography for Semiconductor Wafer Defect Detection and Review," Proceedings of SPIE: Design, Process Integration, and Characterization for Microelectronics, Vol. 4692, pp. 180-194, March 6-7, 2002. (PDF Document)
Weisenberger, A. G., Kross, B., Majewski, S., Popov, V., Smith, M. F., Welch, B., Wojcik, R., Paulus, M. J., Goddard, J. S., Gleason, S. S., Meikle, S. R., Pomper, M., “Development of a Restraint Free Small Animal SPECT Imaging System,” Academy of Molecular Imaging Annual Conference, San Diego, California, October 2002.
Goddard, J. S., “Four-Dimensional Characterization of Paper Web at the Wet End,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM 2000/387, January 2001. (PDF Document)
Sari-Sarraf, H., Goddard, J. S., Abidi, B. R., and Hunt, M. A., "Vision System for On-Line Characterization of Paper Slurry," International Journal of Imaging Systems and Technology 11(4), 231- 242, 2000.
Hunt, M. A., Goddard, Jr., J. S., Ferrell, R. K., Mullens, J. A., Whitus, B. R., Ben-Porath, A., “Hierarchical-Based Multiple Classifier System for Automatic Defect Classification,” Proceedings of SPIE: Metrology, Inspection, and Process Control for Microlithography XIV, February 2000.
Tobin, Jr., K. W., Hunt, M. A., Goddard, Jr., J. S., Hylton, K. W., Richards, R. K., Simpson, M. L., and Treece, D.A., “Accommodating Multiple Illumination Sources in an Imaging Colorimetry Environment,” Proceedings of SPIE: Machine Vision Applications in Industrial Inspection VIII, Vol. 3966, January 2000. (PDF Document)
Abidi, B. R., Sari-Sarraf, H., Goddard, J. S., and Hunt, M. A., “Facet Model and Mathematical Morphology for Surface Characterization,” Proceedings of SPIE: Intelligent Robots and Computer Vision XVIII: Algorithms, Techniques, and Active Vision, Vol. 3837, September 1999. (PDF Document)
Sari-Sarraf, H. and Goddard, J. S., “Vision System for On-Loom Fabric Inspection,” IEEE Transactions on Industry Applications, November/December 1999. (PDF Document)
Goddard, J. S., Sari-Sarraf, H., Turner, J. C., Hunt, M. A., and Abidi, B. R., “Depth Measurement of Moving Slurry at the Wet End of a Paper Machine,” Proceedings of SPIE: Machine Vision Applications in Industrial Inspection VII, Vol. 3652, January 1999. (PDF Document)
Hunt, M. A., Goddard, J. S., Hylton, K. W., Karnowski, T. P., Simpson, M. L., Tobin, Jr., K. W., and Treece, D. A., “Tristimulus Color Measurement of Printed Textile Patterns Using the POCS Algorithm,” Proceedings of SPIE: Machine Vision Applications in Industrial Inspection VII, Vol. 3652, January 1999.
Tobin, K.W., Goddard, J.S., and Thomas, C.E., “Defect Detection and Analysis on Direct-to-Digital Holographic Imagery,” Technology Transfer 98123641 A-TR, SEMATECH, Austin, Texas, December 1998.
Sari-Sarraf, H., Goddard, J. S., Turner, J. C., Hunt, M. A., and Abidi, B. R., “On-Line Characterization of Slurry for Monitoring Headbox Performance,” TAPPI Process and Product Quality Conference, Milwaukee, Wisconsin, October 1998.
Sari-Sarraf, H. and Goddard, J. S., “Robust Defect Segmentation in Woven Fabrics,” IEEE Conference on Computer Vision and Pattern Recognition, Santa Barbara, California, June 1998. (PDF Document)
Goddard, J. S., "Pose and Motion Estimation Using Dual Quaternion-Based Extended Kalman Filtering," Proceedings of SPIE: Three-Dimensional Image Capture and Applications, Vol. 3313, January 1998.
Patek, D. R., Goddard, J. S., and Karnowski, T. P., “Rule-Based Inspection of Printed Green Ceramic Tape,” Proceedings of SPIE: Machine Vision Applications in Industrial Inspection VI, Vol. 3306, January 1998.
Goddard, J. S., Pose and Motion Estimation from Vision Using Dual Quaternion-Based Extended Kalman Filtering, Ph.D. Dissertation, University of Tennessee, Knoxville, 1997.
Sari-Sarraf, H. and Goddard, J. S., “Four Dimensional Characterization of Paper Web at Wet End,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM-13528, October 1997. (PDF Document)
Sari-Sarraf, H. and Goddard, J. S., “On-Line Optical Measurement and Monitoring of Yarn Density in Woven Fabrics,” Photonics China ' 96 Symposium on Automated Optical Inspection for Industry: Theory, Technology, and Application, Beijing, China, pp. 444-452, November 1996. (PDF Document)
Hunt, M. A., Gleason, S. S., Goddard, J. S., Karnowski, T. P., Sari-Sarraf, H. , Sitter, D. N., and Tobin, K. W., “Sort Floor Optical Inspection Tool: A Feasibility Study,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM-5302, September 1996.
Jatko, W. B ., Goddard, J. S., Ferrell, R. K., Gleason, S. S., Hicks, J. S., and Varma, K., “Crusader Automated Docking System Phase III Report,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM- 13177, March 1996.
Tobin, K. W., Allen, D. B., Goddard, J. S., Jones, J. P., Sitter, D. N., Tapp, E. R., and Turner, J. C., “RGB Field System Data Collection and Testing for Textile Print Finishing,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM-13097, September 1995.
Jatko, W. B., Goddard, J. S., Gleason, S. S., and Ferrell, R. K., “Docking Related Technology Phase II Report,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM-12870, April 1995. (PDF Document)
Goddard, J. S., Jatko, W. B., Ferrell, R. K., and Gleason, S. S., "Robust Determination for Autonomous Docking," ANS 6th Topical Meeting on Robotics and Remote Systems, Monterey, California, February 1995. (PDF Document)
Sitter, Jr., D. N., Goddard, J. S., and Ferrell, R. K., “Method for the Measurement of the Modulation Transfer Function of Sampled Imaging Systems from Bar-Target Patterns,” Applied Optics 34(4), 746-751, 1995.