Curriculum Vita
Regina K. Ferrell
P.O. Box 2008, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6075
Wk: (865) 574-5730, Fax: (865) 576-8993
E-mail: ferrellrk@ornl.gov
Experience
Regina K. Ferrell joined the Imaging, Signals, and Machine Learning Group at Oak Ridge National Laboratory in 1992 as a research and development staff member. She has over 25 years of experience in the fields of image and data analysis and systems integration. Her experience includes data acquisition and analysis work on a number of equipment operational pilots for evaluation of RFID tagging technology and radiation detection devices in the work environment for the Defense Logistics Agency and the Domestic Nuclear Detection Office. Her present research involves developing techniques for identifying and characterizing nuclear facilities from satellite imagery. She has worked in the field of content-based image retrieval using both satellite imagery and semiconductor defect imagery. Her most recent work has also involved correlating maintenance data with related sensor data and facilitating methods for complex analysis of vehicle operating conditions for an instrumented light artillery vehicle. She is presently interested in evaluation and best practices for collection and analysis of big data sets.
Education
| M.S. | Electrical Engineering, University of Tennessee, Knoxville, Tennessee, 1992. |
| B.S. | Electrical Engineering. University of Tennessee, Knoxville, Tennessee, 1983. |
Issued and Pending Patents
Ferrell, R. K., Tobin, K. W., Karnowski, T. P., “Method for Indexing and Retrieving Manufacturing-Specific Digital Imagery Based on Image Content”, ERID No. 0668/Q&B 6321-131, September 1999. U.S. Patent No. TBD, 2004.
Ferrell, R. K., Tobin. K. W., Karnowski, T. P., Ferrell, R. K., “Method for Localizing and Isolating an Errant Process Step”, U.S. Patent No. 6,535,776, March 18, 2003.
Recent Awards
Significant Event Award for "Marine Corps Program Management Office Light Armored Vehicle", ORNL Award, 2010.
Significant Event Award for "Air Cargo Explosives Detection Pilot Program", ORNL Award, September 2007.
National Federal Laboratory Consortium Award for “Automated Image Retrieval System for Semiconductor Yield Improvement,” recognition for Excellence in Technology Transfer, May 2003.
Southeast Region Federal Laboratory Consortium Award for “Automated Image Retrieval Technology,” recognition for Excellence in Technology Transfer, January 2003.
R&D Magazine’s R&D 100 Award for applied research in the development of the Defect Source Identifier – Automated Image Retrieval (DSI-AIR) System for Semiconductor Image Data Management, 2002.
UT-Battelle, LLC, Awards Night Director’s Award for Outstanding Team Accomplishment in Science and Technology, for Successful Development of a Content-Based Image Retrieval System for Semiconductor Yield Improvement October 2002.
Selected Publications
Gleason SS, Ferrell RK, Cheriyadat A, Vatsavai R, De S, “Semantic Information Extraction from Multispectral Geospatial Imagery via a Flexible Framework,” Invited Paper, IEEE International Geoscience and Remote Sensing Symposium, 2010.
Vatsavai, R., Cheriyadat, A., Gleason, S., Ferrell, R., “Supervised Semantic Classification for Nuclear Nonproliferation Monitoring,” IEEE Applied Imagery and Pattern Recognition Workshop, 2010.
Gleason SS, Ferrell RK, Ramachandran J, Vatsavai RR, “Large Scale Geospatial Image Indexing and Retrieval to Detect Nuclear Proliferation Activity,” National Research Forum 2.0, NGA Innovation Directorate, Oak Ridge National Laboratory, April 2009.
Ferrell, R. K, Gleason, S. S., and Tobin, K. W., “Application of Fractal Encoding Techniques for Image Segmentation,” IEEE/SME/SPIE 6th International Conference on Quality Control by Artificial Vision, Proceedings of the SPIE, Vol. 5132, May 2003.
Gleason, S. S., Ferrell, R. K., Karnowski, T. P., Tobin, K. W., “Detection of Semiconductor Defects Using A Novel Fractal Encoding Algorithm,” Design, Process Integration, and Diagnostics in IC Manufacturing, Proceedings of the SPIE, Vol. 4692, March 2002.
Tobin, K. W., Karnowski, T. P., Arrowood, L. F., Ferrell, R. K., Goddard, J. S., and Lakhani, F., “Content-Based Image Retrieval for Semiconductor Process Characterization,” EURASIP Journal on Applied Signal Processing, Special Issue on Applied Visual Inspection, Vol. 2002, No. 7, 2002.
Karnowski, T. P., Tobin, K. W., Ferrell, R. K., and Lakhani, F., “Using an Image Retrieval System for Image Data Management,” Design, Process Integration, and Diagnostics in IC Manufacturing, Proceedings of the SPIE, Vol. 4692, March 2002.
Ferrell, R. K. and Tobin, K. W, “Adaptation of a Focus-of-Attention Technique to the Identification of Potential Threat Regions in Carry-On Baggage Imagery,” Third International Aviation Security Technology Symposium, Atlantic City, New Jersey, 2001.
Karnowski, T. P., Tobin, K. W., Arrowood, L. F., Goddard, J. S., Ferrell, R. K., and Lakhani, F., “Field Test Results of an Image Retrieval System for Semiconductor Yield Learning,” Metrology-Based Control for Micro-Manufacturing, Proceedings of the SPIE, Vol. 4275, 2001, pp. 41-52.
Karnowski, T. P., Tobin, K. W., Ferrell, R. K., and Lakhani, F., “Content Based Image Retrieval for Semiconductor Manufacturing,” Machine Vision Applications in Industrial Inspection, Proceedings of SPIE, Vol. 3966, 2000, pp. 162-172, March 2000.
Tobin, K. W., Karnowski, T. P., and Ferrell, R. K., “Image Retrieval in the Industrial Environment,” Machine Vision Applications in Industrial Inspection VII, Proceedings of SPIE, Vol. 3652, January 1999, p. 184-192.
Jatko, W. B., Goddard, J. S., Gleason, S. S., and Ferrell, R. K., “Docking Related Technology Phase II Report,” Oak Ridge National Laboratory, Oak Ridge, Tennessee, ORNL/TM-12870, April 1995.
Goddard, J. S., Jatko, W. B., Ferrell, R. K., and Gleason, S. S., “Robust Determination for Autonomous Docking,” ANS 6th Topical Meeting on Robotics and Remote Systems, Monterey, California, February 1995.
Sitter, Jr., D. N., Goddard, J. S., and Ferrell, R. K., “Method for the Measurement of the Modulation Transfer Function of Sampled Imaging Systems from Bar-Target Patterns,” Applied Optics, Vol. 34, No. 4, pp. 746-751, 1995.