Industrial Inspection Research

Factsheets
Automatic Defect Classification for Semiconductor Wafer Inspection and Review
No Current Events
September 2012
April 2012
ISML Group Book Chapter in Medical Imaging edited by Okechukwu Felix Erondu released online
June 2011
ISML Iris Project Highlighted on Page 3 in the Energy and Environmental Sciences Quaterly Newsletter
September 2010
July 2010
ISML publishes book chapter on x-ray micro-CT technology
March 2010
This news insert contains our monthly activites for the current year. Please visit our ISML News and Events Archive for older topics.
Highlights for 2009
Highlights for 2008
Highlights for 2007
Highlights for 2006
Highlights for 2005
Highlights for 2004