Curriculum Vita
Kenneth W. Tobin Jr., Ph.D.
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Ken Tobin, MSSE Director
Corporate Research Fellow
Measurement Science and Systems Engineering Division
Oak Ridge National Laboratory
P.O. Box 2008, MS-6168
Oak Ridge, Tennessee 37831-6168
Office: (865) 574-0355
E-mail: tobinkwjr@ornl.gov
Experience
Dr. Tobin is the Director of the Measurement Science and Systems Engineering (MSSE) Division at the Oak Ridge National Laboratory (ORNL), Oak Ridge, Tennessee, USA, where he has been working in various R&D capacities since 1987. He has extensive experience in R&D, R&D leadership, management, and strategic organization and planning. The MSSE Division is composed of 170 research, technical, and administrative staff who perform R&D in measurement science associated with electronics, sensors, signals, communications, and integrated systems. As Director, he is responsible for the strategic direction of the organization and for supporting the mission areas of the U.S. Department of Energy and ORNL.
Dr. Tobin was named an ORNL Corporate Research Fellow in 2003 for his contributions to the field of applied computer vision research that addressed industrial and economic competitiveness, biomedical measurement science, and national security. He has authored and co-authored over 135 publications and he currently holds ten U.S. Patents with three additional patents pending in areas of computer vision, photonics, radiography, and microscopy. Dr. Tobin is a Fellow of the International Society for Optics and Photonics (SPIE) where he is currently an Associate Editor for the Journal of Electronic Imaging. He is also a Fellow of the Institute of Electrical and Electronics Engineers for his contributions to computer vision technology instrumentation and measurement. He was the recipient of the R&D 100 Award by R&D Magazine in 2002 and again in 2010 for his work in content-based image retrieval applied to both industry and biomedicine. He was the Tennessee Academy of Science Industrial Scientist of the Year in 2000 for his Leadership and Scientific Contributions to Semiconductor Metrology.
Education
Ph.D. Nuclear Engineering, University of Virginia, Charlottesville, Virginia, 1987.
Dissertation: Digital Filtering and Reconstruction of Coded Aperture Images.
M.S. Nuclear Engineering, Virginia Polytechnic Institute and State University, Blacksburg, Virginia, 1984.
Thesis: Iodine Spiking in Pressurized Water Reactors.
B.S. Physics, Virginia Polytechnic Institute and State University, Blacksburg, Virginia, 1983.
Issued and Pending Patents
Tobin, K.W., Karnowski, T.P., Lakhani, F., “Method for the Reduction of Image Content Redundancy in Large Image Databases”, UT-Battelle, LLC, Invention Disclosure No. 1485, US DOE S-105,086, U.S. Patent No. 7,672,976, March 2, 2010.
Tobin, K.W., Bingham, P.R., Hawari, A., “Method to Achieve High-Resolution Microscopy with Non-Diffracting or Refracting Radiation,” UT-Battelle, LLC, Invention Disclosure No. 1300002076, May 2009.
Karnowski, T.P., Tobin, K.W., Govindasamy, P., “Method for Confidence Metric in Optic Disk Location in Retinal Images,” UT-Battelle, LLC, Invention Disclosure No. 2031, March 2008.
Tobin, K.W., Karnowski, T.P., Chaum, E., “A Method for the Diagnosis of Blinding Eye Disease using Image Content and an Archive of Diagnosed Human Patient Data,” UT-Battelle, LLC, Invention Disclosure No. 1596, DOE No. S-105,198, July 2005.
Hanson, G.R., Bingham, P.R., Tobin, K.W., “Spatial-Heterodyne Interferometry for Reflection and Transmission (SHIRT) Measurements,” UT-Battelle, LLC, Invention Disclosure No. 1225, DOE S-101,813, U.S. Patent No. 6,999,178 B2, February 14, 2006.
Bingham, P.R., Hanson, G.R., Tobin, K.W., “Spatial-heterodyne interferometry for transmission (SHIFT) measurements,” UT-Battelle, LLC, Invention Disclosure No. 1224, DOE S-101,812, U.S. Patent No. 7,119,905, October 10, 2006.
Tobin, K.W., Karnowski, T.P., Ferrell, R.K., “Method for Indexing and Retrieving Manufacturing-Specific Digital Imagery Based on Image Content,” ERID No. 0668 / Q&B 6321-131, U.S. Patent No. 6,751,343, June 15, 2004.
Tobin, K.W., Karnowski, T.P., Ferrell, R.K., “Method for Localizing and Isolating an Errant Process Step,” U.S. Patent No. 6,535,776, March 18, 2003.
Paulus, M.J., Sari-Sarraf, H., Tobin, K.W., Gleason, S.S., Thomas, C.E., “Ultra-High Resolution Computed Tomography Imaging,” U.S. Patent No. 6,421,409, July 16, 2002.
Tobin, K.W., Thomas, C.E., "X-ray Confocal Coded Aperture Imaging System,” U.S. Patent No. 6,195,412, February 27, 2001.
Tobin, K.W., Jr., Gleason, S.S., Karnowski, T.P., and Sari-Sarraf H., “Automated Defect Signature Analysis for Semiconductor Manufacturing Process Improvement,” U.S. Patent No. 5,982,920, January 7, 1997.
Dooley, J.B., Muhs, J.D., Tobin, K.W., “Fiber Optic Vibration Sensor,” U.S. Patent No. 5,381,492, January 10, 1995.
Muhs, J.D., Jordan, J.K., Tobin, K.W., LaForge, J.V., “Apparatus for Weighing and Identifying Characteristics of a Moving Vehicle,” U.S. Patent No. 5,260,520, November 9, 1993.
Selected Awards
Elected to the grade of Fellow of IEEE, The Institute of Electrical and Electronics Engineers, November 2011.
American Telemedical Association (ATA) Innovation Award for development of the TRIAD Ocular Telehealth Network, April 2011.
Southeast Region Federal Laboratory Consortium Award for “TRIAD (Telemedical Retinal Image Analysis and Diagnosis),” recognition for Excellence in Technology Transfer, October 2010.
R&D Magazine’s R&D 100 Award for applied research in the development of the Telemedical Retinal Image Analysis and Diagnosis (TRIAD) System and Technology, November, 2010.
Southeast Region Federal Laboratory Consortium Award for “TRIAD (Telemedical Retinal Image Analysis and Diagnosis),” recognition for Excellence in Technology Transfer, October 2010.
UT-Battelle, LLC, Awards Night Recognition for Excellence in Technology Transfer for Successful Technology Transfer of a Creative and Innovative Application of ORNL Technology to Solve Important High-Impact Problems in Public Health Care, September 2010.
Southeast Region Federal Laboratory Consortium Award for “Automated Image Retrieval: Semiconductor-Specific Image Retrieval Method and System,” recognition for Excellence in Technology Transfer, August 2007.
SPIE Symposium on Medical Imaging, Conference on Visualization, Image-Guided Procedures, and Display, “Best Poster” of session and “Cum Laude” poster, February 2006.
National Federal Laboratory Consortium Award for “MicroCAT Small Animal Imaging System,” recognition for Excellence in Technology Transfer, May 2005.
Southeast Region Federal Laboratory Consortium Award for “MicroCAT Small Animal Imaging System,” recognition for Technology Transfer Project of the Year, September 2004.
Elected to the grade of Senior Member of IEEE, The Institute of Electrical and Electronics Engineers, August 2004.
National Federal Laboratory Consortium Award for “Automated Image Retrieval System for Semiconductor Yield Improvement,” recognition for Excellence in Technology Transfer, May 2003.
Southeast Region Federal Laboratory Consortium Award for “Automated Image Retrieval Technology,” recognition for Excellence in Technology Transfer, January 2003.
R&D Magazine’s R&D 100 Award for applied research in the development of the Defect Source Identifier – Automated Image Retrieval (DSI-AIR) System for Semiconductor Image Data Management, 2002.
National Federal Laboratory Consortium Award for Excellence in Technology Transfer, “Direct-to-Digital Holography for High-Speed, High Resolution Defect Inspection,” March 2002.
Southeast Region Federal Laboratory Consortium Award for “Direct-to-Digital Holography for High-Speed, High Resolution Defect Inspection,” recognition for the new category of Excellence in Technology Transfer Award of the Year, November 2002.
Elected to the grade of Fellow of SPIE, The International Society for Optical Engineering, March 2001.
UT-Battelle, LLC, Awards Night Director’s Award for Outstanding Team Accomplishment in Science and Technology, for Successful Development of a Content-based Image Retrieval System for Semiconductor Yield Improvement October 2002.
UT-Battelle, LLC, Awards Night Recognition for Distinguished Engineer (Individual) for Developing an Internationally Recognized Program in Computer Vision and Semiconductor Metrology, November 2001.
Tennessee Academy of Science, Industrial Scientist of the Year, for Leadership and Scientific Contributions to Semiconductor Metrology, November 2000.
Selected Publications
Karnowski, T.P., Li, Y., Giancardo, L., Aykac, D., Tobin, K.W., Chaum, E., (Togesan, K., Goldschmidt, L., Cuadros, J., Eds.), “Automated Image Analysis and the Application of Diagnostic Algorithms in an Ocular Telehealth Network,” Digital Teleretinal Screening Under Teleophthalmology in Practice, Springer-Verlag, New York, New York, April 28, 2012.
Giancardo, L., Meriaudeau, F., Karnowski, T.P., Li, Garg, S., Tobin, K.W., Chaum, E., “Exudate-based Diabetic Macular Edema Detection in Fundus Images Using Publicly Available Datasets,” (Accepted) Medical Image Analysis, 2011.
Li, Y., Karnowski, T.P., Tobin, K.W., Giancardo, L., Morris, S., Sparrow, S.E., Garg, S., Fox, K., Chaun, E., “A HIPAA Compliant Ocular Telehealth Network for the Remote Diagnosis and Management of Diabetic retinopathy,” Telemedicine and e-Health, Vol. 17, No. 8, October 2011.
Giancardo, L., Meriaudeau, Karnowski, T.P., Tobin, K.W., Favaro, P., Ruggeri, A., Chaum, E., “Textureless Macula Swelling Detection with Multiple Retinal Fundus Images,” IEEE Transactions on Biomedical Engineering, Vol. 58, No. 3, March 2011.
Karnowski, T.P., Li, Y., Giancardo, G., Aykac, D., Garg, S., Abramoff, M.D., Tennant, M.T., Tobin, K.W., and Chaum, E., (Dua, S., Acharya, R., Ng, E. Eds.), “Automating the Diagnosis, Stratification, and Management of Diabetic Retinopathy Using Content-Based Image Retrieval in an Ocular Telehealth Network,” Computational Analysis of the Human Eye with Applications, World Scientific Publications, March 2011.
Giancardo, L., Meriaudeau, F., Karnowski, T.P., Chaum, E., Tobin, K., “Quality Assessment of Retinal Fundus Images using Elliptical Local Vessel Density,” IN-TECH, New Developments in Biomedical Engineering. 2010, pp. 201–224.
Giancardo, L., Meriaudeau, F., Karnowski, T.P., Chaum, E., Tobin, K.W., (Campolo, D., Editor), “Quality Assessment of Retinal Fundus Images using Elliptical Local Vessel Density,” New Developments in Biomedical Engineering, INTECH Online, January 2010.
Tobin, K.W., Bingham, P.R., Gregor, J. (Anderson, Ian S., et al., Eds.), “Mathematics of Neutron Imaging,” Neutron Imaging and Applications, Springer-Verlag, (In Press) January 2009.
Paquit, V.C., Tobin, K.W., Price, J.R., Mériaudeau, F., “3D and Multispectral Imaging for Subcutaneous Veins Detection,” Optics Express, Vol. 17, No. 14, July 2009, pp. 11360-11365.
Mann, C., Binham, P.R., Paquit, V., Tobin, K.W., “Quantitative Phase Imaging by Three-Wavelength Digital Holography,” Optics Express, Vol. 16, No. 13, 2008, pp. 9753-9764.
Tobin, K.W., Chaum, E., Gregor, J., Price, J.R., Wall, J., Karnowski, T.P., (G. Schaefer, Editor) “Image Informatics for Clinical and Preclinical Biomedical Analysis,” Computational Intelligence in Medical Imaging: Techniques and Applications, CRC Press, Nov. 26, 2008.
Tobin, K.W., Abramoff, M.D., Chaum, E., Giancardo, L., Govindasamy, V.P., Karnowski, T.P., Tennant, M.T.S., “Using a Patient Image Archive to Diagnose Retinopathy,” in 30th Annual International Conf. of the IEEE EMBS, Vancouver, Canada, August 2008.
Giancardo, L., Abramoff, M.D., Chaum, E., Karnowski, T.P., Meriaudeau, F., and Tobin, K.W., “Elliptical Local Vessel Density: a Fast and Robust Quality Metric for Fundus Images,” in 30th Annual International Conf. of the IEEE EMBS, Vancouver, Canada, August 2008.
Karnowski, T.P., Govindasamy, V.P., Tobin, K.W., Chaum, E., and Abramoff, M.D., “Retina Lesion and Microaneurysm Segmentation using Morphological Reconstruction Methods with Ground-Truth Data,” in 30th Annual International Conf. of the IEEE EMBS, Vancouver, Canada, August 2008.
Tobin, K.W., Abdelrahman, M., Chaum, E., Govindasamy, P., and Karnowski, T.P., “A Probabilistic Framework for Content-Based Diagnosis of Retinal Disease,” 29th Annual International Conf. of the IEEE EMBS, August 2007, Lyon, France, August 2007.
Tobin, K.W., Lead Writer, “Entry and Access Portals,” National Plan for Research and Development in Support of Critical Infrastructure Protection, The Executive Office of the President, Office of Science and Technology Policy, 2004.
Mann, C., Binham, P.R., Paquit, V., Tobin, K.W., “Quantitative Phase Imaging by Three-Wavelength Digital Holography,” Optics Express, Vol. 16, No. 13, 2008, pp. 9753-9764.
Chaum, E., Abdelrahman, M., Karnowski T.P., Govindasamy, P.G., Tobin, K.W., “Automated Diagnosis of Retinopathy by Content-Based Image Retrieval,” Retina, Vol. 28, No. 10, Nov.-Dec. 2008, pp 1463-77.
Tobin, K.W., Chaum, E., Govindasamy, V.P., Karnowski, T.P., “Detection of Anatomic Structures in Human Retinal Imagery,” IEEE Transactions on Medical Imaging, Vol. 26, No. 12, December 2007.
Bourgeat, P., Tobin, K.W., Gorria, P., Meriaudeau, F., “Gabor Feature Extraction on Complex Images: Application to Defect Detection on Semiconductors,” The Imaging Science Journal, Vol. 54, No. 4, December 2006.
Tobin, K.W., Bhaduri, B.L., Bright, E.A., Cheriyadat, A., Karnowski, T.P., Palathingal, P.J., Potok, T.E., Price, J.R., “Automated Feature Generation in Large-Scale Geospatial Libraries for Content-Based Indexing,” Journal of Photogrammetric Engineering and Remote Sensing, Vol. 72, No. 5, May 2006.
Bingham, P.R., Price, J.R., Tobin, K.W., Karnowski, T.P., “Semiconductor Sidewall Shape Estimation,” SPIE Journal of Electronic Imaging, Vol. 13, No. 3, July 2004.
Bourgeat, P., Meriaudeau, F., Tobin, K.W., Gorria, P., “Patterned Wafer Segmentation,” SPIE Journal of Electronic Imaging, Vol. 13, No. 3, July 2004.
Weber, C., Sankaran, V., Tobin, K.W., “Quantifying the Value of Ownership of Yield Analysis Technologies,” IEEE Transactions on Semiconductor Manufacturing, Vol. 15, No. 4, November 2002.
Tobin, K. W., Karnowski, T.P., Arrowood, L.F., Ferrell, R.K., Goddard, J.S., Lakhani, F., “Content-based Image Retrieval for Semiconductor Process Characterization,” EURASIP Journal on Applied Signal Processing, Vol. 2002, No. 7, 2002.
Tobin, K.W., Karnowski, T.P., “Revolutionizing Defect Image Management,” SPIE’s OE Magazine, Vol. 1, No. 7, July 2001.
Tobin, K.W., Neiberg, L., “Metrology Data Management and Information Systems,” (Alain C. Diebold, Editor) Handbook of Silicon Semiconductor Metrology, Alain Diebold, Editor, Marcel Dekker, Inc., New York, New York, 2001.
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