The Materials Microcharacterization Collaboratory

Participants

Objective

Approach

Accomplishments

Plans

Tools Available

Publications

Demonstrations

Partners

 Oak Ridge National Laboratory  http://www.ornl.gov/doe2k/ornl
Michael Wright, Edward Kenik, Edgar Voelkl, Larry Allard, Jim Rome, Cyrus Smith, Linda Horton, Camden Hubbard, Ted Nolan, Gene Ice

Lawrence Berkeley National Laboratory   http://www-itg.lbl.gov/ITG.hm.pg.docs/MMC/mmc.html
Michael A. O'Keefe, Bahram Parvin, John Taylor, Ulrich Dahmen

University of Illinois, Urbana-Champaign  http://cmm-sun.mrl.uiuc.edu/
Jim Mabon, Virginia Metze, Gernot Metze

National Institutes of Standards and Technology  http://www.mel.nist.gov/namt/projects/tele/tele1.htm
Michael Postek, Sam Jones

Argonne National Laboratory  http://tpm.amc.anl.gov/
Nestor Zaluzec

Industrial Partners

Gatan Inc.
RJ Lee Instruments Ltd.
EMiSPEC Systems, Inc.
Philips Electron Optics
NSA - Hitachi Scientific Instruments
JEOL USA, Inc.
Sun Microsystems, Inc.
Graham Technology Solutions, Inc.

Project Home Page:

  http://tpm.amc.anl.gov/MMC
Michael Wright   wrightmc@ornl.gov
Updated:
Visitors: since 19-Feb-1999