Niton XL 300 and XL 700

SitePro NITON XL-300

The XL-300 Series spectrum analyzer, which is designed to quantify only lead, is an energy dispersive x-ray fluorescence (EDXRF) spectrometer that uses a sealed, 40 mCi cadmium-109 radioisotope source to excite characteristic x-rays of a test sample's constituent elements. These characteristic x-rays are continuously detected, identified, and quantified by the spectrometer during sample analysis. The energy of each x-ray detected identifies a particular element present in the sample, and the rate at which x-rays of a given energy are counted provides a determination of the quantity of that element that is present in the sample. Detection of the characteristic lead x-rays is achieved using a highly efficient, thermo-electrically cooled, solid-state, silicon PIN-diode detector, a part of the Dual Detector system. Signals from the Dual Detector are amplified, digitized, and then quantified via integral multichannel analysis and data processing units. Sample test results are displayed in total micrograms of lead per dust wipe. During this verification test, the spectrum analyzer configuration was XL-309 (2 month old source) and reporting limits were approximately 15 :g/wipe.

SitePro NITON XL-700

The XL-700 Series spectrum analyzer is an energy dispersive x-ray fluorescence (EDXRF) spectrometer that uses one to three sealed, radioisotope sources to excite characteristic x-rays of a test sample's constituent elements. These characteristic x-rays are continuously detected, identified, and quantified by the spectrometer during sample analysis. In this test, the exact model used was XL-723S with two sources (10 mCi Cd-109 and 14 mCi Am-241). The Cd-109 source, the source which was used for the lead analysis, was approximately 11 months old. The energy of each x-ray detected identifies a particular element present in the sample, and the rate at which x-rays of a given energy are counted provides a determination of the quantity of that element that is present in the sample. Detection of the characteristic lead x-rays is achieved using a highly efficient, thermo-electrically cooled, solid-state, Big-Area Silicon PIN-diode (BASP) detector. Signals from the BASP are amplified, digitized, and then quantified via integral multichannel analysis and data processing units. Sample test results are displayed in total micrograms of lead per dust wipe. NITON's XL-700 Series XRF spectrum analyzer reporting limits were 4.9 to 6.1 :g/wipe during the verification test.



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