Cont@ct:
Mitchel J.Doktycz
Biological & Nanoscale Systems Group
Life Sciences Division
Oak Ridge National Laboratories
PO Box 2008 MS 6123
Oak Ridge, TN 37831-6123
Fax: (865) 574-6210
e-mail:

 

Phone: (865)-574-6207

Sankar Venkataraman is a post-masters research associate at the Oak Ridge National Laboratory. He completed his Masters in Electrical Engineering at The University of Tennessee, Knoxville in 2005. He did his Bachelor of Engineering in the field of Electronics and instrumentation from Muffakham Jha College of Engineering Technology, where he worked on the design of a Microcontroller based electro oculogram stimulator at Osmania University in 2003. He joined the Biological and Nanoscale Systems Group in May 2004 and worked on the automation of fluorescence image analysis to identify positive protein-protein interactions. Apart from Image processing, Pattern recognition and Computer vision, he also has interests in Biomedical and Nano-scale instrumentation. His current research interests involves automated AFM image analysis and data fusion.

Outside work, Sankar likes to hit the road taking long drives.

Publications

1. Venkatraman, S., Doktycz, M. J., Qi, H. Morrell-Falvey, J. L. (2005) “Automated analysis of fluorescence microscopy images to identify protein-protein interactions” Submitted for publication.

2. S. Venkataraman, D.P. Allison, H. Qi, J.L. Morrell-Falvey, N.L. Kallewaard, J.E. Crowe Jr., M.J. Doktycz,(2006) "Automated image analysis of atomic force microscopy images of Rotavirus particles", Ultramicroscopy, In press

3. M. A. Beckmann, S. Venkataraman, M. J. Doktycz, J. P. Natarod, C. J. Sullivan, J. L. Morrell-Falvey, D. P. Allison, (2006) "Measuring Cell Surface Elasticity on Enteroaggregative Escherichia coli Wild Type and Dispersin Mutant by AFM", Ultramicroscopy, In press

Conference Proceedings

1. Venkataraman, S., Doktycz, M. J., Qi, H. Morrell-Falvey, J. L. (2005) “Automated image analysis for fluorescent microscopic images to identify protein-protein interactions” IEEE EMBS Annual international conference, Sept 2005, Shanghai. (One among top 15 papers selected for the student competition)

2. S. Venkataraman, J.L. Morrell-Falvey, H. Qi, D.P. Allison, M.J. Doktycz,(2005), “Automated statistical analysis of atomic force microscopy images”, Scanning Probe Microscopy, Sensors and Nanostructures, Cancun2005. (Poster presentation)

Oral Presentations

“Automated image analysis for fluorescent microscopic images to identify protein-protein interactions” IEEE EMBS Annual international conference, Sept 2005, Shanghai, China. (Student paper competition, finalist)