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Thursday, March 21
Characterization of Nanomaterials by X-rays:
Martijn Fransen, PANalytical B.V., Almelo, The Netherlands
Size Distribution, Shape Analysis, and Local
Structure with Minimal Sample Preparation
Materials Science and Technology Division Seminar
3:00 PM — 4:00 PM, High Temperature Materials Laboratory (Building 4515), Room 265
Contact: Tom Watkins (firstname.lastname@example.org), 865.387.6472
AbstractNanomaterials exhibit unique properties which has made them a hot topic in research lately. X-ray scattering has proven to be a valuable characterization technique for nanomaterials, as it gives average properties over a large sample volume, in contrast to electron microscopy. Techniques like Small Angle X-ray Scattering (SAXS), Pair Distribution Function (PDF) analysis and Grazing Incidence Small Angle X-ray Scattering (GI-SAXS) are extensively used at synchrotron beamlines and sometimes also on dedicated laboratory instruments. What is less known, is that also modern multi-purpose powder diffractometers can cover these applications. In this seminar, I will show examples of the data quality that is nowadays possible with these instruments.