Measurement of Thermoelectric Properties of a Single Nanowire

Apr
17
2014
01:30 PM - 02:30 PM
Jae-Yong Song, Korea Research Institute of Standards and Science, Yuseong-gu, Daejoen, South Korea
Materials Science and Technology Division Seminar
High Temperature Materials Laboratory (Building 4515), Room 265
CONTACT :
Email: Hsin Wang
Phone:865.576.5074
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With growing worldwide demand for energy harvesting, capturing waste heat with thermoelectric coolers and generators has driven the development of high figure-of-merit (FOM) thermoelectric materials. Since the theoretical predictions in the mid-1990s that the FOM could be greatly enhanced by nanoengineering, interest in thermoelectrics has resurged with the emergence of nanostructural engineering, e.g., nanograins, twins, nanoinclusions, and point defects. KRISS staff scientists have been developing the technologies of measuring thermoelectric properties of bulk, thin films, and nanowires since 2008. In this talk, the research activities on thermoelectric measurement technologies in KRISS are introduced. Especially, the microdevice-based thermoelectric measurement technology of a single nanowire is presented in more detail. The effects of twins on thermoelectric properties of Bi2Te3 nanowires are discussed in light of Seebeck coefficients following the Pisarenko relation as well as thermal conductivities.

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