- Number 297 |
- October 12, 2009
Simultaneous nanoscale imaging of surface and bulk atoms
Joe Wall (left) and Yimei Zhu
Scientists at DOE's Brookhaven Lab have demonstrated a new scanning electron microscope capable of selectively imaging single atoms on the top surface of a specimen while a second, simultaneous signal shows atoms throughout the sample’s depth. This new tool, located at the Lab’s Center for Functional Nanomaterials (CFN), represents a fourfold improvement in surface-imaging resolution. It will greatly expand scientists’ ability to visualize atomic arrangements and the bonding states of atoms engaged in chemical reactions, and enhance their understanding of how surface and bulk atoms work together. This information could lead to the rational design of new materials, such as catalysts for improved energy-conversion devices.
[Karen McNulty Walsh, 631.344.8350,